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MT58L64L32F Datasheet(PDF) 10 Page - Micron Technology |
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MT58L64L32F Datasheet(HTML) 10 Page - Micron Technology |
10 / 24 page 10 2Mb: 128K x 18, 64K x 32/36 Flow-Through SyncBurst SRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. MT58L128L18F_2.p65 – Rev. 6/01 ©2000, Micron Technology, Inc. 2Mb: 128K x 18, 64K x 32/36 FLOW-THROUGH SYNCBURST SRAM IDD OPERATING CONDITIONS AND MAXIMUM LIMITS (Note: 1) (0°C ≤ T A ≤ +70°C; VDD = +3.3V +0.3V/-0.165V unless otherwise noted) DESCRIPTION CONDITIONS SYM TYP -6.8 -7.5 -8.5 -10 UNITS NOTES Power Supply Device selected; All inputs ≤ VIL or ≥ VIH; Current: Operating Cycle time ≥ tKC (MIN); IDD 65 265 245 225 150 mA 2, 3, 4 VDD = MAX; Outputs open Power Supply Device selected; VDD = MAX; Current: Idle ADSC#, ADSP#, ADV#, GW#, BWx# ≥ IDD1 20 70 65 65 50 mA 2, 3, 4 VIH; All inputs ≤ VSS + 0.2 or ≥ VDD - 0.2; Cycle time ≥ tKC (MIN); Outputs open CMOS Standby Device deselected; VDD = MAX; All inputs ≤ VSS + 0.2 or ≥ VDD - 0.2; ISB2 0.5 10 10 10 10 mA 3, 4 All inputs static; CLK frequency = 0 TTL Standby Device deselected; VDD = MAX; All inputs ≤ VIL or ≥ VIH;ISB3 6 25252525 mA 3, 4 All inputs static; CLK frequency = 0 Clock Running Device deselected; VDD = MAX; ADSC#, ADSP#, ADV#, GW#, BWx# ≥ ISB4 20 70 65 65 50 mA 3, 4 VIH; All inputs ≤ VSS + 0.2 or ≥ VDD - 0.2; Cycle time ≥ tKC (MIN) MAX NOTE: 1. VDDQ = +3.3V +0.3V/-0.165V for 3.3V I/O configuration; VDDQ = +2.5V +0.4V/-0.125V for 2.5V I/O configuration. 2. IDD is specified with no output current and increases with faster cycle times. IDDQ increases with faster cycle times and greater output loading. 3. “Device deselected” means device is in power-down mode as defined in the truth table. “Device selected” means device is active (not in power-down mode). 4. Typical values are measured at 3.3V, 25°C and 15ns cycle time. 5. VDDQ = +3.3V +0.3V/-0.165V for 3.3V I/O configuration; VDDQ = +2.5V +0.4V/-0.125V for 2.5V I/O configuration. 6. IDD is specified with no output current and increases with faster cycle times. IDDQ increases with faster cycle times and greater output loading. 7. “Device deselected” means device is in power-down mode as defined in the truth table. “Device selected” means device is active (not in power-down mode). 8. Typical values are measured at 3.3V, 25°C, and 15ns cycle time. |
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