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LMP7704MT Datasheet(PDF) 6 Page - National Semiconductor (TI) |
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LMP7704MT Datasheet(HTML) 6 Page - National Semiconductor (TI) |
6 / 22 page ±5V Electrical Characteristics (Note 4) (Continued) Unless otherwise specified, all limits are guaranteed for T A = 25˚C, V + = 5V, V− = −5V, V CM = 0V, and RL > 10 k Ω to 0V. Boldface limits apply at the temperature extremes. Symbol Parameter Conditions Min (Note 6) Typ (Note 5) Max (Note 6) Units V O Output Swing High R L =2k Ω to 0V LMP7701 90 150 170 mV from V + R L =2k Ω to 0V LMP7702/LMP7704 90 180 290 R L =10k Ω to 0V LMP7701 40 80 100 R L =10k Ω to 0V LMP7702/LMP7704 40 80 150 Output Swing Low R L =2k Ω to 0V LMP7701 90 130 150 mV from V – R L =2k Ω to 0V LMP7702/LMP7704 90 180 290 R L =10k Ω to 0V LMP7701 40 50 60 R L =10k Ω to 0V LMP7702/LMP7704 40 60 110 I O Output Short Circuit Current (Notes 3, 9) Sourcing V O =0V V IN = 100 mV (LMP7701) 50 35 86 mA Sourcing V O =0V V IN = 100 mV (LMP7702/LMP7704) 48 33 86 Sinking V O =0V V IN = −100 mV 50 35 84 I S Supply Current LMP7701 0.790 1.1 1.3 mA LMP7702 1.7 2.1 2.5 LMP7704 3.2 4.2 5.0 SR Slew Rate (Note 10) A V = +1, VO =9VPP 10% to 90% 1.1 V/µs GBW Gain Bandwidth Product 2.5 MHz THD+N Total Harmonic Distortion + Noise f = 1 kHz, A V =1,RL =10k Ω 0.02 % e n Input-Referred Voltage Noise f = 1 kHz 9 nV/ i n Input-Referred Current Noise f = 100 kHz 1 fA/ Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test conditions, see the Electrical Characteristics Tables. Note 2: Human Body Model is 1.5 k Ω in series with 100 pF. Machine Model is 0Ω in series with 200 pF. Note 3: The maximum power dissipation is a function of TJ(MAX), θJA, and TA. The maximum allowable power dissipation at any ambient temperature is PD =(TJ(MAX) -TA)/ θJA . All numbers apply for packages soldered directly onto a PC board. Note 4: Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device. Note 5: Typical values represent the parametric norm at the time of characterization. Note 6: Limits are 100% production tested at 25˚C. Limits over the operating temperature range are guaranteed through correlations using the Statistical Quality Control (SQC) method. Note 7: Guaranteed by design. Note 8: Positive current corresponds to current flowing into the device. Note 9: The short circuit test is a momentary test. Note 10: The number specified is the slower of positive and negative slew rates. www.national.com 6 |
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