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SN74CBT16233DL Datasheet(PDF) 2 Page - Texas Instruments |
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SN74CBT16233DL Datasheet(HTML) 2 Page - Texas Instruments |
2 / 9 page SN74CBT16233 16-BIT 1-OF-2 FET MULTIPLEXER/DEMULTIPLEXER SCDS010K – MAY 1995 – REVISED NOVEMBER 2001 2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 FUNCTION TABLE (each multiplexer/demultiplexer) INPUTS FUNCTION SEL TEST FUNCTION L L A = B1 H L A = B2 X H A = B1 and A = B2 logic diagram (positive logic) 8B1 1B1 8A 1A SEL1 1B2 8B2 TEST1 1 45 30 27 56 55 11 12 16B1 9B1 16A 9A SEL2 9B2 16B2 TEST2 15 31 29 28 42 41 25 26 absolute maximum ratings over operating free-air temperature range (unless otherwise noted)† Supply voltage range, VCC –0.5 V to 7 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Input voltage range, VI (see Note 1) –0.5 V to VCC + 0.5 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Continuous channel current 128 mA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Input clamp current, IIK (VI < 0) –50 mA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Package thermal impedance, θJA (see Note 2): DGG package 64 °C/W . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . DGV package 48 °C/W . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . DL package 56 °C/W . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Storage temperature range, Tstg –65 °C to 150°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . † Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed. 2. The package thermal impedance is calculated in accordance with JESD 51-7. |
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