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| CS5166 |
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ONSEMI |
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4 page
CS5166 http://onsemi.com 4 ELECTRICAL CHARACTERISTICS (continued) (0°C < TA < 70°C; 0°C < TJ < 125°C; 8.0 V < VCC < 14 V; 2.0 DAC Code: (VID4 = VID3 = VID2 = VID1 = 0); CGATE(H) = CGATE(L) = 3.3 nF; COFF = 330 pF; CSS = 0.1 μF, unless otherwise specified.) Characteristic Unit Max Typ Min Test Conditions GATE(H) and GATE(L) High Voltage at 100 mA Measure VCC − GATE − 1.2 2.0 V Low Voltage at 100 mA Measure GATE − 1.0 1.5 V Rise Time 1.6 V < GATE < (VCC − 2.5 V) − 40 80 ns Fall Time (VCC − 2.5 V) > GATE > 1.6 V − 40 80 ns GATE(H) to GATE(L) Delay GATE(H) < 2.0 V; GATE(L) > 2.0 V 30 65 100 ns GATE(L) to GATE(H) Delay GATE(L) < 2.0 V; GATE(H) > 2.0 V 30 65 100 ns GATE pull−down Resistor to PGND, Note 3 20 50 115 kΩ Fault Protection SS Charge Time VFB = 3.0 V, VISENSE = 2.8 V 1.6 3.3 5.0 ms SS Pulse Period VFB = 3.0 V, VISENSE = 2.8 V 25 100 200 ms SS Duty Cycle (Charge Time/Period) × 100 1.0 3.3 6.0 % SS COMP Clamp Voltage VFB = 2.7 V; VSS = 0 V 0.50 0.95 1.10 V VFB Low Comparator Increase VFB till normal off−time 0.9 1.0 1.1 V PWM Comparator Transient Response VFB = 1.2 to 5.0 V. 500 ns after GATE(H) (after Blanking time) to GATE(H) = (VCC −1.0 V) to 1.0 V − 115 175 ns Minimum Pulse Width (Blanking Time) Drive VFB 1.2 V to 5.0 V upon GATE(H) rising edge (> VCC − 1.0 V), measure GATE(H) pulse width 100 200 300 ns COFF Normal Off−Time VFB = 2.7 V 1.0 1.6 2.3 μs Extended Off−Time VSS = VFB = 0 V 5.0 8.0 12.0 μs Time−Out Timer Time−Out Time VFB = 2.7 V, Measure GATE(H) Pulse Width 10 30 50 μs Fault Duty Cycle VFB = 0V 30 50 70 % Power Good Output Low to High Delay VFB = (0.8 × VDAC) to VDAC 30 65 110 μs High to Low Delay VFB = VDAC to (0.8 × VDAC) 30 75 120 μs Output Low Voltage VFB = 2.4 V, IPWRGD = 500 μA − 0.2 0.3 V Sink Current Limit VFB = 2.4 V, PWRGD = 1.0 V 0.5 4.0 15.0 mA 3. Guaranteed by design, not 100% tested in production. |
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