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NCV2574 Datasheet(PDF) 2 Page - ON Semiconductor |
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NCV2574 Datasheet(HTML) 2 Page - ON Semiconductor |
2 / 26 page LM2574, NCV2574 http://onsemi.com 2 Figure 1. Block Diagram and Typical Application 7.0 − 40 V Unregulated DC Input L1 330 mH Pwr Gnd +Vin 5 Cin 22 mF 4ON/OFF 3 Output 7 Feedback 1 D1 1N5819 Cout 220 mF Typical Application (Fixed Output Voltage Versions) Representative Block Diagram and Typical Application Unregulated DC Input +Vin 5 Cout Feedback 1 Cin L1 D1 R2 R1 1.0 k Output 7 Pwr Gnd 4 ON/OFF 3 Reset Latch Thermal Shutdown 52 kHz Oscillator 1.235 V Band−Gap Reference Freq Shift 18 kHz Comparator Fixed Gain Error Amplifier Current Limit Driver 1.0 Amp Switch ON/OFF 3.1 V Internal Regulator Vout Load Output Voltage Versions 3.3 V 5.0 V 12 V 15 V R2 ( W) 1.7 k 3.1 k 8.84 k 11.3 k For adjustable version R1 = open, R2 = 0 W LM2574 5.0 V Regulated Output 0.5 A Load Sig Gnd 2 Sig Gnd 2 (12) (14) (3) (4) (6) (5) (5) (12) (3) (4) (14) (6) NOTE: Pin numbers in ( ) are for the SO−16W package. ABSOLUTE MAXIMUM RATINGS (Absolute Maximum Ratings indicate limits beyond which damage to the device may occur). Rating Symbol Value Unit Maximum Supply Voltage Vin 45 V ON/OFF Pin Input Voltage − −0.3 V ≤ V ≤ +Vin V Output Voltage to Ground (Steady State) − −1.0 V DW Suffix, Plastic Package Case 751G Max Power Dissipation PD Internally Limited W Thermal Resistance, Junction−to−Air RqJA 145 °C/W N Suffix, Plastic Package Case 626 Max Power Dissipation PD Internally Limited W Thermal Resistance, Junction−to−Ambient RqJA 100 °C/W Thermal Resistance, Junction−to−Case RqJC 5.0 °C/W Storage Temperature Range Tstg −65 °C to +150°C °C Minimum ESD Rating − 2.0 kV (Human Body Model: C = 100 pF, R = 1.5 k W) Lead Temperature (Soldering, 10 seconds) − 260 °C Maximum Junction Temperature TJ 150 °C Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected. NOTE: ESD data available upon request. |
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