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MC100ELT28MNR4G Datasheet(PDF) 2 Page - ON Semiconductor

Part # MC100ELT28MNR4G
Description  5 V TTL to Differential PECL and Differential PECL to TTL Translator
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

MC100ELT28MNR4G Datasheet(HTML) 2 Page - ON Semiconductor

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MC10ELT28, MC100ELT28
http://onsemi.com
2
Figure 1. 8−Lead Pinout (Top View) and Logic
Diagram
1
2
3
45
6
7
8
QTTL
GND
VCC
DECL
DTTL
QECL
QECL
DECL
PECL
TTL
Table 1. PIN DESCRIPTION
Pin
Function
QTTL
TTL Outputs
DTTL
TTL Data Inputs
QECL, QECL
PECL Differential Outputs
DECL, DECL
PECL Differential Inputs
VCC
Positive Supply
GND
Ground
EP
Exposed pad must be connected to a
sufficient thermal conduit. Electrically
connect to the most negative supply or
leave floating open.
Table 2. ATTRIBUTES
Characteristics
Value
ESD Protection
Human Body Model
> 2 kV
Moisture Sensitivity, Indefinite Time Out of Drypack (Note 1)
Pb Pkg
Pb−Free Pkg
SOIC−8
TSSOP−8
DFN8
Level 1
Level 1
Level 1
Level 1
Level 3
Level 1
Flammability Rating
Oxygen Index: 28 to 34
UL 94 V−0 @ 0.125 in
Transistor Count
71 Devices
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
1. For additional information, see Application Note AND8003/D.
Table 3. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Unit
VCC
Positive Power Supply
GND = 0 V
7
V
VIN
Input Voltage
GND = 0 V
VI  VCC
0 to 6
V
Iout
PECL Output Current
Continuous
Surge
50
100
mA
mA
TA
Operating Temperature Range
−40 to +85
°C
Tstg
Storage Temperature Range
−65 to +150
°C
qJA
Thermal Resistance (Junction−to−Ambient)
0 lfpm
500 lfpm
SOIC−8
SOIC−8
190
130
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case)
Standard Board
SOIC−8
41 to 44
°C/W
qJA
Thermal Resistance (Junction−to−Ambient)
0 lfpm
500 lfpm
TSSOP−8
TSSOP−8
185
140
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case)
Standard Board
TSSOP−8
41 to 44 ± 5%
°C/W
qJA
Thermal Resistance (Junction−to−Ambient)
0 lfpm
500 lfpm
DFN8
DFN8
129
84
°C/W
°C/W
Tsol
Wave Solder
Pb
Pb−Free
<2 to 3 sec @ 248°C
<2 to 3 sec @ 260°C
265
265
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.


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