MC74HC157A

http://onsemi.com

4

Guaranteed Limit

Unit

v 125_C

v 85_C

– 55 to

25

_C

V

Test Conditions

Parameter

Symbol

Maximum Low−Level Output

Voltage

2.0

4.5

6.0

0.1

0.1

0.1

0.1

0.1

0.1

0.1

0.1

0.1

V

3.0

4.5

6.0

0.26

0.26

0.26

0.33

0.33

0.33

0.4

0.4

0.4

Maximum Input Leakage Current

6.0

± 0.1

± 1.0

± 1.0

mA

Maximum Three−State Leakage

Current

Output in High−Impedance State

6.0

± 0.5

± 5.0

± 10

mA

Maximum Quiescent Supply

Current (per Package)

6.0

4.0

40

160

mA

NOTE: Information on typical parametric values can be found in Chapter 2 of the ON Semiconductor High−Speed CMOS Data Book

(DL129/D).

Symbol

Parameter

V

Guaranteed Limit

Unit

– 55 to

25

_C

v 85_C

v 125_C

Maximum Propagation Delay, Input A or B to Output Y

(Figures 1 and 4)

2.0

3.0

4.5

6.0

105

65

21

18

130

85

26

22

160

115

32

27

ns

Maximum Propagation Delay, Select to Output Y

(Figures 2 and 4)

2.0

3.0

4.5

6.0

110

70

22

19

140

90

28

24

165

115

33

28

ns

Maximum Propagation Delay, Output Enable to Output Y

(Figures 3 and 4)

2.0

3.0

4.5

6.0

100

60

20

17

125

80

25

21

150

110

30

26

ns

Maximum Output Transition Time, Any Output

(Figures 1 and 4)

2.0

3.0

4.5

6.0

75

27

15

13

95

32

19

16

110

36

22

19

ns

Maximum Input Capacitance

−

10

10

10

pF

NOTE: For propagation delays with loads other than 50 pF, and information on typical parametric values, see Chapter 2 of the ON

Semiconductor High−Speed CMOS Data Book (DL129/D).

Power Dissipation Capacitance (Per Package)*

Typical @ 25

pF

33

ON Semiconductor High−Speed CMOS Data Book (DL129/D).