MC74HC393A

http://onsemi.com

4

Unit

Guaranteed Limit

V

Test Conditions

Parameter

Symbol

Unit

v 125_C

v 85_C

– 55 to

25_C

V

Test Conditions

Parameter

Symbol

Maximum Low−Level Output

Voltage

2.0

4.5

6.0

0.1

0.1

0.1

0.1

0.1

0.1

0.1

0.1

0.1

V

3.0

4.5

6.0

0.26

0.26

0.26

0.33

0.33

0.33

0.40

0.40

0.40

6.0

± 0.1

± 1.0

± 1.0

mA

Maximum Quiescent Supply

Current (per Package)

6.0

4

40

160

mA

NOTE: Information on typical parametric values can be found in Chapter 2 of the ON Semiconductor High−Speed CMOS Data Book

(DL129/D).

Symbol

Parameter

V

Guaranteed Limit

Unit

– 55 to

25_C

v 85_C

v 125_C

Maximum Clock Frequency (50% Duty Cycle)

(Figures 1 and 3)

2.0

3.0

4.5

6.0

10

15

30

50

9

14

28

45

8

12

25

40

MHz

Maximum Propagation Delay, Clock to Q1

(Figures 1 and 3)

2.0

3.0

4.5

6.0

70

40

24

20

80

45

30

26

90

50

36

31

ns

Maximum Propagation Delay, Clock to Q2

(Figures 1 and 3)

2.0

3.0

4.5

6.0

100

56

34

20

105

70

45

38

180

100

55

48

ns

Maximum Propagation Delay, Clock to Q3

(Figures 1 and 3)

2.0

3.0

4.5

6.0

130

80

44

37

150

105

55

47

180

130

70

58

ns

Maximum Propagation Delay, Clock to Q4

(Figures 1 and 3)

2.0

3.0

4.5

6.0

160

110

52

44

250

185

65

55

300

210

82

65

ns

Maximum Propagation Delay, Reset to any Q

(Figures 2 and 3)

2.0

3.0

4.5

6.0

80

48

30

26

95

65

38

33

110

75

50

43

ns

Maximum Output Transition Time, Any Output

(Figures 1 and 3)

2.0

3.0

4.5

6.0

75

27

15

13

95

32

19

16

110

36

22

19

ns

Maximum Input Capacitance

—

10

10

10

pF

NOTES:

1. For propagation delays with loads other than 50 pF, see Chapter 2 of the ON Semiconductor High−Speed CMOS Data Book (DL129/D).

2. Information on typical parametric values can be found in Chapter 2 of the ON Semiconductor High−Speed CMOS Data Book (DL129/D).

Power Dissipation Capacitance (Per Counter)*

pF

35

ON Semiconductor High−Speed CMOS Data Book (DL129/D).