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NB7L111MMN Datasheet(PDF) 6 Page - ON Semiconductor

Part # NB7L111MMN
Description  2.5V / 3.3V, 6.125Gb/s 1:10 Differential Clock/Data Driver with CML Output
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

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NB7L111M
http://onsemi.com
6
Table 6. AC CHARACTERISTICS VCC = 2.375 V to 2.625 V and 3.135 V to 3.465 V, VEE = 0 V; (Note 10)
Symbol
Characteristic
−40°C
25°C
85°C
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
VOUTPP Output Voltage Amplitude (@ Vinppmin)
(See Figures 3, 4, 5, and 6)
VCC = 2.375 V to 2.625 V
fin ≤ 3 GHz
fin ≤ 5.5 GHz
VCC = 3.135 V to 3.465 V
fin ≤ 3 GHz
fin ≤ 5.5 GHz
240
115
250
130
330
220
350
250
240
115
250
130
330
220
350
250
240
115
250
130
330
220
350
250
mV
fDATA
Maximum Operating Data Rate
5
6
5
6
5
6
Gb/s
tPLH,
tPHL
Differential Input−to−Output Propagation Delay
@ 1 GHz (See Figures 7 and 11)
CLK−Q
SEL−Q
200
290
240
340
280
390
200
290
240
340
280
390
200
290
240
340
280
390
ps
tSKEW
Duty Cycle Skew (Note 11)
Within Device Skew
Device−to−Device Skew (Note 15)
2
10
15
15
20
80
2
10
15
15
20
80
2
10
15
15
20
80
ps
tJITTER
RMS Random Clock Jitter (Note 13)
fin = 3 GHz
fin = 5.5 GHz
Peak−to−Peak Data Dependent Jitter
(Note 14)
fDATA = 3.125 Gb/s
fDATA = 5 Gb/s
fDATA = 6.125 Gb/s
0.2
0.2
6
15
15
0.5
0.5
15
25
25
0.2
0.2
6
15
15
0.5
0.5
15
25
25
0.2
0.2
6
15
15
0.5
0.5
15
25
25
ps
VINPP
Input Voltage Swing/Sensitivity
(Differential Configuration)
(Note 12 and Figures 3, 4, 5, and 6)
75
400
2500
75
400
2500
75
400
2500
mV
tr
tf
Output Rise/Fall Times @ 1 GHz
(20% − 80%)
50
75
50
75
50
75
ps
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
10.Measured by forcing VINPP(MIN) from a 50% duty cycle clock source. All loading with an external RL = 50 W to VCC. Input edge rates 40 ps
(20% − 80%).
11. Duty cycle skew is measured between differential outputs using the deviations of the sum of Tpw− and Tpw+ @ 1 GHz.
12.VINPP(MAX) cannot exceed VCC − VEE. Input voltage swing is a single−ended measurement operating in differential mode.
13.Additive RMS jitter with 50% duty cycle clock signal.
14.Additive peak−to−peak data dependent jitter with input NRZ data at PRBS 223−1.
15.Device−to−device skew is measured between outputs under identical transition and conditions @ 1 GHz.


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