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NB2309AI1HDG Datasheet(PDF) 5 Page - ON Semiconductor |
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NB2309AI1HDG Datasheet(HTML) 5 Page - ON Semiconductor |
5 / 9 page NB2309A http://onsemi.com 5 Table 6. SWITCHING CHARACTERISTICS (Commercial and Industrial) (Note 6) Parameter Description Test Conditions Min Typ Max Unit 1/t1 Output Frequency 30 pF load 10 pF load 15 15 100 133.33 MHz 1/t1 Duty Cycle = (t2 / t1) * 100 (−1, −1H) (−1H) Measured at 1.4 V, FOUT = 66.67 MHz < 50 MHz 40 45 50 50 60 55 % t3 Output Rise Time (−1, −1H) (−1H) Measured between 0.8 V and 2.0 V 2.5 1.5 ns t4 Output Fall Time Measured between 2.0 V and 0.8 V 1.5 ns t5 Output−to−Output Skew All outputs equally loaded 250 ps t6 Delay, REF Rising Edge to CLKOUT Rising Edge Measured at VDD/2 0 ±350 ps t7 Device−to−Device Skew Measured at VDD/2 on the CLKOUT pins of the device 0 700 ps t8 Output Slew Rate Measured between 0.8 V and 2.0 V using Test Circuit #2 1 V/ns tJ Cycle−to−Cycle Jitter Measured at 66.67 MHz, loaded outputs 200 ps tLOCK PLL Lock Time Stable power supply, valid clock presented on REF pin 1.0 ms trin REF Input Rise Time Measured between 0.8 V to 2.0 V 1.0 ns tfin REF Input Rise Fall Time Measured between 2.0 V to 0.8 V 1.0 ns 6. All parameters specified with loaded outputs and apply to both PLL−Mode and PLL−Bypass Mode. |
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