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A1321EUA-T Datasheet(PDF) 11 Page - Allegro MicroSystems

Part # A1321EUA-T
Description  Ratiometric Linear Hall Effect Sensor for High-Temperature Operation
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Manufacturer  ALLEGRO [Allegro MicroSystems]
Direct Link  http://www.allegromicro.com
Logo ALLEGRO - Allegro MicroSystems

A1321EUA-T Datasheet(HTML) 11 Page - Allegro MicroSystems

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Ratiometric Linear Hall Effect Sensor
for High-Temperature Operation
A1321, A1322,
and
A1323
11
Allegro MicroSystems, Inc.
115 Northeast Cutoff, Box 15036
Worcester, Massachusetts 01615-0036 (508) 853-5000
www.allegromicro.com
The products described herein are manufactured under one or more of the following U.S. patents: 5,045,920; 5,264,783; 5,442,283; 5,389,889;
5,581,179; 5,517,112; 5,619,137; 5,621,319; 5,650,719; 5,686,894; 5,694,038; 5,729,130; 5,917,320; and other patents pending.
Allegro MicroSystems, Inc. reserves the right to make, from time to time, such departures from the detail specifications as may be required to
permit improvements in the performance, reliability, or manufacturability of its products. Before placing an order, the user is cautioned to verify that
the information being relied upon is current.
Allegro products are not authorized for use as critical components in life-support devices or systems without express written approval.
The information included herein is believed to be accurate and reliable. However, Allegro MicroSystems, Inc. assumes no responsibility for its
use; nor for any infringement of patents or other rights of third parties which may result from its use.
Copyright © 2004, 2006, Allegro MicroSystems, Inc.
Package UA, 3-Pin SIP
B
D
D
D
.164
.159
4.17
4.04
.122
.117
3.10
2.97
.062
.058
1.57
1.47
.017
.014
0.44
0.35
.019
.014
0.48
0.36
.640
.600
16.26
15.24
.085
MAX
2.16
.050
NOM
1.27
.031
REF
0.79
.0805
NOM
2.04
1.44
.0565
NOM
Dimensions in inches
Metric dimensions (mm) in brackets, for reference only
23
1
A
A
B
C
C
Dambar removal protrusion (6X)
Active Area Depth .0195 [0.50] NOM
D Hall element (not to scale)
Ejector mark on opposite side


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