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NCP5201 Datasheet(PDF) 6 Page - ON Semiconductor

Part # NCP5201
Description  Dual Output DDR Power Controller
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

NCP5201 Datasheet(HTML) 6 Page - ON Semiconductor

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NCP5201
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6
DETAILED OPERATION DESCRIPTIONS
General
The NCP5201 Dual DDR Power Controller combines
the efficiency of a PWM controller for the VDDQ supply
with the simplicity of a linear regulator for the VTT
memory
termination voltage. VTT is designed to
automatically track at half VDDQ.
The inclusion of an internal PWM switching FET for
VDDQ standby operation, both VDDQ and VTT power
good voltage monitors, soft−start, undervoltage detection,
and thermal shutdown, make this device a total power
solution for high current DDR memory systems. The IC is
packaged in 5
× 6 QFN−18.
IC Control States
The state decode logic and internal control functions are
powered by 5.0 V VSTBY. An internal voltage reference
and bias current block is enabled when VSTBY exceeds
3.8 V. Once VREF reaches its regulation voltage, internal
signal _VREFGD will be asserted HIGH. This transition
wakes up the voltage monitor block, which in turn detects
whether the VSTBY and VCC voltages are within certain
preset regulation levels. If they are, the voltage monitor
generates an internal HIGH VSTGD and 12 VGD
respectively.
There is an internal detection for 100% duty cycle of
TGDDQ switching, if it occurs, an internal signal
MAXDTY is asserted HIGH.
The logic control block accepts an external signal at the
S3_EN pin and internal voltage monitor signals MXDTY,
12 VGD and VSTGD to decode the operating states in
accordance with Table 1. PWRGD is an open−drain logic
output that signifies VDDQ and VTT are both in regulation
in the S0 mode.
Table 1. Control Logic State Truth Table
Input Conditions
Operation Mode
VSTGD
S3_EN
12 VGD
MAXDTY
Prev.
Next
Low
X
X
X
X
S5
High
Low
Low
X
X
S5
High
Low
High
X
X
S0
High
High
High
Low
S0
S0
High
High
X
High
S0
S3
High
High
Low
X
S0
S3
High
High
X
X
S3
S3
VDDQ Regulator in Normal (SO) mode
The VDDQ regulator in S0 mode is a switching
synchronous rectification buck controller directly driving
two external N−Channel power FETs. An external resistor
divider sets the nominal output voltage. The control
architecture is voltage mode fixed frequency PWM with
external compensation, and with switching frequency
fixed at 250 kHz
±10%. As can be observed from Figure 1,
the VDDQ output voltage is divided down and fed back to
pin FBDDQ. This voltage connects to the inverting input
of the internal error amplifier while the amplifier’s
noninverting input is connected to an internal voltage
reference, VREF (= 1.3 V). The amplifier compares the
feedback voltage to VREF and outputs an error signal to the
PWM comparator. This error signal is compared with a
fixed frequency RAMP waveform derived from the
internal oscillator to generate a pulse−width−modulated
signal. This PWM signal drives the external N−Channel
Power FETs via the TGDDQ and BGDDQ pins. External
inductor L and COUT1 filter the output waveform, which
is subsequently fed back to FBDDQ via a resistor voltage
divider to close the loop at VDDQ = VFBQ (1 + R2/R1).
An adjustable soft−start is implemented, activated each
time the IC exits state S5. When in normal mode, and
regulation of VDDQ is detected, signal INREGDDQ will
go HIGH to notify the Control Logic block.
Tolerance of VDDQ
The tolerance of VFBQ and the ratio of external resistor
divider R7/R10 both impact the precision of VDDQ. With
the control loop in regulation, VDDQ = (VFBQ)
(1 + R7/R10). With a worst case (for all valid operating
conditions) VFBQ tolerance of
±2%, a worst case range of
±2.5% for VDDQ will be assured if the ratio R7/R10 is
specified as 0.9230
±1%.
Synchronous Rectification
For enhanced efficiency, an active synchronous switch is
used to eliminate the conduction loss contributed by the
forward voltage of a diode or Schottky diode rectifier.
Adaptive nonoverlap timing control of the complementary
gate drive output signals is provided to reduce large
shoot−through currents, which degrade efficiency.


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