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NLAST4051DTR2G Datasheet(PDF) 2 Page - ON Semiconductor |
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NLAST4051DTR2G Datasheet(HTML) 2 Page - ON Semiconductor |
2 / 12 page Figure 2. Logic Diagram NO4 NO7 Inhibit NO6 NO3 ADDA LOGIC ADDB ADDC NO5 NO2 NO1 NO0 COM NLAST4051 http://onsemi.com 2 TRUTH TABLE Inhibit Address ON SWITCHES* C B A 1 X don’t care X don’t care X don’t care All switches open 0 0 0 0 COM−NO0 0 0 0 1 COM−NO1 0 0 1 0 COM−NO2 0 0 1 1 COM−NO3 0 1 0 0 COM−NO4 0 1 0 1 COM−NO5 0 1 1 0 COM−NO6 0 1 1 1 COM−NO7 *NO and COM pins are identical and interchangeable. Either may be considered an input or output; signals pass equally well in either direction. MAXIMUM RATINGS Symbol Parameter Value Unit VEE Negative DC Supply Voltage (Referenced to GND) −7.0 to )0.5 V VCC Positive DC Supply Voltage (Note 1) (Referenced to GND) (Referenced to VEE) −0.5 to )7.0 −0.5 to )7.0 V VIS Analog Input Voltage VEE −0.5 to VCC )0.5 V VIN Digital Input Voltage (Referenced to GND) −0.5 to 7.0 V I DC Current, Into or Out of Any Pin $50 mA TSTG Storage Temperature Range −65 to )150 °C TL Lead Temperature, 1 mm from Case for 10 Seconds 260 °C TJ Junction Temperature under Bias )150 °C qJA Thermal Resistance SOIC TSSOP QSOP 143 164 164 °C/W PD Power Dissipation in Still Air SOIC TSSOP QSOP 500 450 450 mW MSL Moisture Sensitivity Level 1 FR Flammability Rating Oxygen Index: 30% − 35% UL 94 V−0 @ 0.125 in VESD ESD Withstand Voltage Human Body Model (Note 2) Machine Model (Note 3) Charged Device Model (Note 4) u2000 u200 u1000 V ILATCHUP Latchup Performance Above VCC and Below GND at 125°C (Note 5) $300 mA Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. The absolute value of VCC $|VEE| ≤ 7.0. 2. Tested to EIA/JESD22−A114−A. 3. Tested to EIA/JESD22−A115−A. 4. Tested to JESD22−C101−A. 5. Tested to EIA/JESD78. |
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