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NLSF1174MNR2 Datasheet(PDF) 2 Page - ON Semiconductor

Part # NLSF1174MNR2
Description  Hex D Flip?묯lop with Common Clock and Reset
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

NLSF1174MNR2 Datasheet(HTML) 2 Page - ON Semiconductor

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NLSF1174
http://onsemi.com
2
Figure 2. LOGIC DIAGRAM
D0
D1
D2
D3
D4
D5
Q0
Q1
Q2
Q3
Q4
Q5
CLOCK
RESET
DATA
INPUTS
NONINVERTING
OUTPUTS
DESIGN/VALUE TABLE
Design Criteria
Value
Unit
Internal Gate Count*
40.5
ea
Internal Gate Propagation Delay
1.5
ns
Internal Gate Power Dissipation
5.0
mW
Speed Power Product
.0075
pJ
*Equivalent to a two−input NAND gate.
MAXIMUM RATINGS
Parameter
Symbol
Value
Unit
DC Supply Voltage
(Referenced to GND)
VCC
*0.5 to )7.0
V
DC Input Voltage
(Referenced to GND)
VIN
*1.5 to VCC )1.5
V
DC Output Voltage
(Referenced to GND) (Note 1)
VOUT
*0.5 to VCC )0.5
V
DC Input Current, per Pin
IIN
$20
mA
DC Output Current, per Pin
IOUT
$25
mA
DC Supply Current, VCC and GND Pins
ICC
$50
mA
Storage Temperature Range
TSTG
*65 to )150
°C
Lead Temperature, 1 mm from Case for 10 Seconds
PDIP, SOIC, TSSOP
TL
260
°C
Junction Temperature Under Bias
TJ
)150
°C
Thermal Resistance
QFN
qJA
80
°C/W
Power Dissipation in Still Air at 85
°C
QFN
PD
800
mW
Moisture Sensitivity
MSL
Level 1
Flammability Rating
Oxygen Index: 30 to 35
FR
UL 94 V−0 @ 0.125 in
ESD Withstand Voltage
Human Body Model (Note 2)
Machine Model (Note 3)
Charged Device Model (Note 4)
VESD
u2000
u100
u500
V
Latchup Performance
Above VCC and Below GND at 85°C (Note 5)
ILATCHUP
$300
mA
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. IO absolute maximum rating must be observed.
2. Tested to EIA/JESD22−A114−A.
3. Tested to EIA/JESD22−A115−A.
4. Tested to JESD22−C101−A.
5. Tested to EIA/JESD78.
6. For high frequency or heavy load considerations, see the ON Semiconductor High−Speed CMOS Data Book (DL129/D).


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