MSK4900U datasheet(2/6 Pages) MSK

Part #	MSK4900U

Description	600V ISOLATED HALF BRIDGE GATE DRIVER

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Manufacturer	MSK [M.S. Kennedy Corporation]

Direct Link	http://www.mskennedy.com

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2 / 6 page

Typ.

15.00

TBD

-

0.15

-

15.0

-5.0

-

TBD

Vcc SUPPLY CHARACTERISTICS

Vcc Voltage

Vcc Current

INPUT/OUTPUT LOGIC

Positive Trigger Input Voltage

Negative Trigger Input Voltage

Open Collector Ouput - VOL

Open Collector Ouput - IOL

OUTPUT CHARACTERISTICS - GATE DRIVE

VOH

VOL

IOH

IOL

ISD

tplh - Propagation Delay Time

tphl - Propagation Delay Time

tr - Rise Time

tf - Fall Time

td - De-Sat Delay Time

De-Sat Trip Voltage

600V

5.5V

18V

TBD

8A

TBD

High Voltage Isolation

Logic Input Voltage

Vcc Supply

Continuous Output Current

Peak Ouput Current

Thermal Resistance

(output drivers - junction to case)

V

mA

V

mA

V

A

µS

V

ABSOLUTE MAXIMUM RATINGS

-65°C to +150°C

+300°C

-40°C to +85°C

-55°C to +125°C

+150°C

TST

TLD

TC

TJ

Parameter

ELECTRICAL SPECIFICATIONS

Units

Max.

15.75

TBD

-

0.8

0.4

1.5

15.75

-4.25

-

TBD

MSK 4900

Typ.

15.00

TBD

-

0.15

-

15.0

-5.0

-

TBD

Test Conditions

Min.

14.25

TBD

2.0

-

14.25

-5.75

8

TBD

Storage Temperature Range

Lead Temperature Range

(10 Seconds)

Case Operating Temperature

MSK4900

MSK4900H/E

Junction Temperature

All Ratings: Tc=+25°C Unless Otherwise Specified

2

Max.

15.75

TBD

-

0.8

0.4

1.5

15.75

-4.25

-

TBD

MSK 4900H/E

Min.

14.25

TBD

2.0

-

14.25

-5.75

8

TBD

NOTES:

1

Guaranteed by design but not tested. Typical parameters are representative of actual device

performance but are for reference only.

2

Industrial grade and "E" suffix devices shall be tested to subgroups 1 and 4 unless otherwise specified.

3

Military grade devices ("H" Suffix) shall be 100% tested to Subgroups 1, 2, 3 and 4.

4

Subgroups 5 and 6 testing available upon request.

5

Subgroup 1, 4 TA = TC = +25°C

2, 5 TA = TC = +125°C

3, 6 TA = TC = -55°C

6

Continuous operation at or above absolute maximum ratings may adversly effect the device

performance and/or life cycle.

Group A

Subgroup

CL=0.33µF, 20KHz pulse

6

PRELIMINARY

Rev. - 1/07

IOL=1.5mA

CL=0.33µF, 20KHz pulse

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