2

SY88923

Micrel, Inc.

M9999-060506

hbwhelp@micrel.com or (408) 955-1690

PACKAGE/ORDERING INFORMATION

10-Pin MSOP (K10-1)

Ordering Information

Package

Operating

Package

Lead

Part Number

Type

Range

Marking

Finish

SY88923KC

K10-1

Commercial

923

Sn-Pb

K10-1

Commercial

923

Sn-Pb

SY88923KG

K10-1

Industrial

923 with

Pb-Free

Pb-Free bar-line indicator

NiPdAu

K10-1

Industrial

923 with

Pb-Free

Pb-Free bar-line indicator

NiPdAu

Note:

1.

Tape and Reel.

1

/EN

LOS

GND

9

8

7

6

2

3

4

5

MSOP

K10-1

Pin

Type

Function

Data Input

Data Input

Data Input

Inverting Data Input

Input

LOS Limit Set

/EN

TTL Input

Output Enable (Active Low)

LOS

TTL Output

Loss of Signal Indicator

(Open Collector)

(Active High)

GND

Ground

Ground

PECL Output

Inverting Data Output

PECL Output

Data Output

Power Supply

Positive Power Supply

Output

Reference Voltage Output for

LOS Level Set (see Fig. 3)

General

The SY88923 is an integrated limiting amplifier intended

for high-frequency fiber-optic applications. The circuit

connects to typical transimpedance amplifiers found within

a fiber-optics link. The linear signal output from a

transimpedance amplifier can contain significant amounts

of noise, and may vary in amplitude over time. The SY88923

limiting amplifier quantizes the signal and outputs a voltage-

limited waveform.

The /EN pin allows the user to disable the output signal

without removing the input signal.

PIN NAMES

GENERAL DESCRIPTION

Symbol

Rating

Value

Unit

Power Supply Voltage

0 to +7.0

V

Input Voltage

V

Output Voltage (with 50

Ω load)

V

Operating Temperature Range

–40 to +85

°C

Storage Temperature Range

–55 to +125

°C

Note:

1. Permanent device damage may occur if absolute maximum ratings are exceeded. This is a stress rating only and functional operation is not implied at

conditions other than those detailed in the operational sections of this data sheet. Exposure to absolute maximum ratlng conditions for extended periods

may affect device reliability.