LOW POWER LOW OFFSET VOLTAGE DUAL COMPARATORS

AZ393/393C

4

Aug. 2006 Rev. 1. 2

BCD Semiconductor Manufacturing Limited

Data Sheet

Note 1: Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to

the device. These are stress ratings only, and functional operation of the device at these or any other conditions

beyond those indicated under "Recommended Operating Conditions" is not implied. Exposure to "Absolute Max-

imum Ratings" for extended periods may affect device reliability.

Note 2: This input current will only exist when the voltage at any of the input leads is driven negative. It is due to

the collector-base junction of the input PNP transistors becoming forward biased and thereby acting as input

diode clamps. In addition to this diode action, there is also lateral NPN parasitic transistor action on the IC chip.

This transistor action can cause the output voltages of the comparators to go to the V+ voltage level (or to ground

for a large overdrive) for the time duration that an input is driven negative. This is not destructive and normal out-

put states will re-establish when the input voltage, which was negative, again returns to a value greater than -0.3

Parameter

Symbol

Value

Unit

Supply Voltage

20

V

Differential Input Voltage

20

V

Input Voltage

-0.3 to 20

V

50

mA

DIP-8

780

mW

SOIC-8

660

Output Short Circuit to Ground

Continuous

Operating Junction Temperature

150

Storage Temperature Range

-65 to 150

Lead Temperature (Soldering, 10 seconds)

260

Absolute Maximum Ratings (Note 1)

Recommended Operating Conditions

Parameter

Symbol

Min

Max

Unit

Supply Voltage

218

V

Operating Temperature Range

-40

85