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CD3207 Datasheet(PDF) 11 Page - NXP Semiconductors |
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CD3207 Datasheet(HTML) 11 Page - NXP Semiconductors |
11 / 14 page Philips Semiconductors Product specification FB2041 7-bit Futurebus+ transceiver 1995 May 25 11 TEST CIRCUIT AND WAVEFORMS 2.5ns 2.5ns 500ns 500ns INPUT PULSE REQUIREMENTS Rep. Rate Amplitude tTLH tTHL 1MHz 3.0V 2.5ns Input Pulse Definitions VM = 1.55V for Bn, VM = 1.5V for all others. VCC Family FB+ D.U.T. PULSE GENERATOR 7.0V RL RL CL RT VIN VOUT Test Circuit for 3-State Outputs on A Port TEST SWITCH SWITCH POSITION tPLZ, tPZL All other closed open DEFINITIONS: RL = Load Resistor; see AC CHARACTERISTICS for value. CL = Load capacitance includes jig and probe capacitance; see AC CHARACTERISTICS for value. RT = Termination resistance should be equal to ZOUT of pulse generators. CD = Load capacitance includes jig and probe capacitance; see AC CHARACTERISTICS for value. RU = Pull up resistor; see AC CHARACTERISTICS for value. tW 90% VM 10% 90% VM 10% 90% VM 10% 90% VM 10% NEGATIVE PULSE POSITIVE PULSE LOW V LOW V tTHL (tf) tTLH (tr) tW BIAS V tW Low V 0.0V tTLH (tr) tTHL (tf) A Port 1MHz 2.0V 2.5ns 1.0V B Port VCC D.U.T. PULSE GENERATOR RU CD RT VIN VOUT Test Circuit for Outputs on B Port BIAS V 2.0V (for RU = 9 Ω) 2.1V (for RU = 16.5 Ω) SG00059 VIN VIN |
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Similar Description - CD3207 |
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