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NC7SBU3157 Datasheet(PDF) 5 Page - Fairchild Semiconductor |
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NC7SBU3157 Datasheet(HTML) 5 Page - Fairchild Semiconductor |
5 / 11 page 5 www.fairchildsemi.com Capacitance (Note 12) Note 12: TA 25qC, f 1 MHz, Capacitance is characterized but not tested in production. Undershoot Characteristic (Note 13) Note 13: This test is intended to characterize the device’s protective capabilities by maintaining output signal integrity during an input transient voltage undershoot event. FIGURE 1. Device Test Conditions Transient Input Voltage (VIN) Waveform Symbol Parameter Typ Max Units Conditions Figure Number CIN Control Pin Input Capacitance 2.3 pF VCC 0V CIO-B B Port Off Capacitance 6.5 pF VCC 5.0V Figure 8 CIOA-ON A Port Capacitance When Switch Is Enabled 18.5 pF VCC 5.0V Figure 9 Symbol Parameter Min Typ Max Units Conditions VOUTU Output Voltage During Undershoot 2.5 VOH - 0.3 V Figure 1 Parameter Value Units VIN see Waveform V R1 R2 100K : VTRI 7.0 V VCC 5.5 V |
Similar Part No. - NC7SBU3157_05 |
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Similar Description - NC7SBU3157_05 |
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