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HEF4001UB Datasheet(PDF) 5 Page - NXP Semiconductors |
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HEF4001UB Datasheet(HTML) 5 Page - NXP Semiconductors |
5 / 8 page January 1995 5 Philips Semiconductors Product specification Quadruple 2-input NOR gate HEF4001UB gates Fig.7 Test set-up for measuring forward transconductance gfs =dio/dvi at vo is constant (see also graph Fig.8). Fig.8 Typical forward transconductance gfs as a function of the supply voltage at Tamb = 25 °C. A : average, B : average + 2 s, C : average − 2 s, in where ‘s’ is the observed standard deviation. |
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