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HEF4011UBN Datasheet(PDF) 3 Page - NXP Semiconductors |
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HEF4011UBN Datasheet(HTML) 3 Page - NXP Semiconductors |
3 / 8 page January 1995 3 Philips Semiconductors Product specification Quadruple 2-input NAND gate HEF4011UB gates AC CHARACTERISTICS VSS = 0 V; Tamb =25 °C; CL = 50 pF; input transition times ≤ 20 ns VDD V SYMBOL TYP. MAX. TYPICAL EXTRAPOLATION FORMULA Propagation delays In → On 5 60 120 ns 25 ns + (0,70 ns/pF) CL HIGH to LOW 10 tPHL 25 50 ns 12 ns + (0,27 ns/pF) CL 15 20 40 ns 10 ns + (0,20 ns/pF) CL 5 35 70 ns 8 ns + (0,55 ns/pF) CL LOW to HIGH 10 tPLH 20 40 ns 9 ns + (0,23 ns/pF) CL 15 17 35 ns 9 ns + (0,16 ns/pF) CL Output transition 5 75 150 ns 15 ns + (1,20 ns/pF) CL times 10 tTHL 30 60 ns 6 ns + (0,48 ns/pF) CL HIGH to LOW 15 20 40 ns 4 ns + (0,32 ns/pF) CL 5 60 110 ns 10 ns + (1,00 ns/pF) CL LOW to HIGH 10 tTLH 30 60 ns 9 ns + (0,42 ns/pF) CL 15 20 40 ns 6 ns + (0,28 ns/pF) CL Input capacitance CIN 10 pF VDD V TYPICAL FORMULA FOR P ( µW) Dynamic power 5 500 fi +∑ (foCL) × VDD2 where dissipation per 10 5 000 fi +∑ (foCL) × VDD2 fi = input freq. (MHz) package (P) 15 25 000 fi +∑ (foCL) × VDD2 fo = output freq. (MHz) CL = load capacitance (pF) ∑ (f oCL) = sum of outputs VDD = supply voltage (V) |
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