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Q-5962D9569301V9A Datasheet(PDF) 5 Page - Intersil Corporation

Part No. Q-5962D9569301V9A
Description  Radiation Hardened Single 16/Differential 8 Channel CMOS Analog Multiplexers with Active Overvoltage Protection
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Maker  INTERSIL [Intersil Corporation]
Homepage  http://www.intersil.com/cda/home
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 5 page
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5
FN3544.4
March 13, 2006
Irradiation Circuit
Burn-In/Life Test Circuits
DYNAMIC AND LIFE TEST
NOTES:
1. The Dynamic Test Circuit is utilized for all life testing.
2. V1 = +15V minimum, +16V maximum.
3. V2 = -15V maximum, -16V minimum.
4. R1, R2 = 10k
Ω, ±5%, 1/4 or 1/2W (per socket).
5. C1, C2 = 0.01
µF minimum (per socket) or 0.1µF minimum
(per row).
6. D1, D2 = 1N4002 or equivalent (per board).
7. F0 = 100kHz, 10%; F1 = F0/2; F2 = F1/2; F3 = F2/2; F4 = F3/2
40% - 60% duty cycle; VIL = 0.8V maximum;
VIH = 4.0V minimum.
STATIC
NOTES:
8. V1 =
+5V minimum, +6V maximum.
9. V2 =
+15V minimum, +16V maximum.
10. V3 = -15V maximum, -16V minimum.
11. R1, R2 = 10k
Ω, ±5%, 1/4 or 1/2W (per socket).
12. C1, C2 = 0.01
µF minimum (per socket) or 0.1µF minimum
(per row).
13. D1, D2 = 1N4002 or equivalent (per board).
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D2 C2
V2
R2
R1
D1
C1
F3
V1
F4
F0
F1
F2
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D2 C2
V3
R2
R1
D1
C1
V2
V1
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10k
+15V
+1V
+5V
NC
-15V
10k
HS-0546RH, HS-0547RH




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