IL3585
Absolute Maximum Ratings
(11)
Parameters
Symbol
Min.
Typ.
Max.
Units
Test Conditions
Storage Temperature
T
S
-65
150
°C
Ambient Operating Temperature
T
A
-40
100
°C
Voltage Range at A or B Bus Pins
-7
12
V
Supply Voltage (1)
V
DD
1, VDD2
-0.5
7
V
Digital Input Voltage
-0.5
V
DD+0.5
V
Digital Output Voltage
-0.5
V
DD+1
V
Recommended Operating Conditions
Parameters
Symbol
Min.
Typ.
Max.
Units
Test Conditions
Supply Voltage
V
DD
1
V
DD
2
3.0
4.5
5.5
5.5
V
Input Voltage at any Bus Terminal
(separately or common mode)
V
I
V
IC
12
-7
V
High-Level Digital Input Voltage
V
IH
2.4
3.0
V
V
DD
1= 3.3 V
V
DD
1= 5.0 V
Low-Level Digital Input Voltage
V
IL
0.8
V
Differential Input Voltage (2)
V
ID
+12/-7
V
High-Level Output Current (Driver)
I
OH
-60
60
mA
High-Level Digital Output Current
(Receiver)
I
OH
-8
8
mA
Low-Level Output Current (Driver)
I
OL
-60
60
mA
Low-Level Digital Output Current
(Receiver)
I
OL
-8
8
mA
Ambient Operating Temperature
T
A
-40
85
°C
Digital Input Signal Rise and Fall
Times
t
IR,tIF
DC Stable
Insulation Specifications
Parameters
Symbol
Min.
Typ.
Max.
Units
Test Conditions
Creepage Distance (external)
8.077
Barrier Impedance
Ω || pF
>1014||7
Leakage Current
0.2
µA
RMS
240 V
RMS, 60 Hz
Safety & Approvals
IEC61010-1
TUV Certificate Numbers:
Approval Pending
Classification
Model
Package
Pollution Degree
Material Group
Max. Working Voltage
IL3585
SOIC (0.3
")
II
III
300 VRMS
UL 1577
Component Recognition program. File #:
Approval Pending
Rated 2500VRMS for 1 minute (SOIC)
Electrostatic Discharge Sensitivity
This product has been tested for electrostatic sensitivity to the limits stated in the specifications. However, NVE recommends that all integrated
circuits be handled with appropriate care to avoid damage. Damage caused by inappropriate handling or storage could range from performance
degradation to complete failure.
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