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FOD814300 Datasheet(PDF) 4 Page - Fairchild Semiconductor |
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FOD814300 Datasheet(HTML) 4 Page - Fairchild Semiconductor |
4 / 12 page 4 www.fairchildsemi.com FOD814 Series, FOD617 Series, FOD817 Series Rev. 1.0.5 Transfer Characteristics (Continued) (TA = 25°C Unless otherwise specified.) Isolation Characteristics *Typical values at TA = 25°C Notes: 1. Current Transfer Ratio (CTR) = IC/IF x 100%. 2. For test circuit setup and waveforms, refer to page 4. 3. For this test, Pins 1 and 2 are common, and Pins 3 and 4 are common. Symbol AC Characteristic Device Test Conditions Min. Typ.* Max. Unit fC Cut-Off Frequency FOD814 VCE = 5V, IC = 2mA, RL = 100Ω, -3dB 15 80 – kHz tr Response Time (Rise) FOD814 VCE = 2 V, IC = 2mA, RL = 100Ω (2) –4 18 µs FOD617 FOD817 tf Response Time (Fall) FOD814 – 3 18 µs FOD617 FOD817 Symbol Characteristic Device Test Conditions Min. Typ.* Max. Units VISO Input-Output Isolation Voltage(3) FOD814 f = 60Hz, t = 1 min, II-O ≤ 2µA 5000 Vac(rms) FOD617 FOD817 RISO Isolation Resistance FOD814 VI-O = 500VDC 5x1010 1x1011 — Ω FOD617 FOD817 CISO Isolation Capacitance FOD814 VI-O = 0, f = 1 MHz 0.6 1.0 pf FOD617 FOD817 |
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