Manufacturer | Part # | Datasheet | Description |
California Eastern Labs |
GET-30704
|
8Mb / 20P |
Qualification Test Results on Si MMIC
|
GET-30497
|
889Kb / 24P |
Qualification Test Results on Si MMIC
|
GET-BC-0006
|
254Kb / 4P |
Qualification Test Results on Si MMIC
|
GET-30593
|
362Kb / 7P |
Qualification Test Report on NE681XX
|
GET-BC-0004
|
606Kb / 20P |
Qualification Test Report on NE292
|
Tyco Electronics |
3-1461491-5
|
369Kb / 40P |
Qualification Test Report
|
AVAGO TECHNOLOGIES LIMI... |
AEAT-7000
|
142Kb / 2P |
The following cumulative test results
|
List of Unclassifed Man... |
AEC-Q100-REV-H
|
814Kb / 48P |
FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR INTEGRATED CIRCUITS
September 11, 2014 |
GSI Technology |
GS8673ED36BK-550I
|
457Kb / 31P |
On-Chip ECC with virtually zero SER
|
GS8673EQ18BGK-500I
|
451Kb / 31P |
On-Chip ECC with virtually zero SER
|