SN65HVD20,SN65HVD21

SN65HVD22,SN65HVD23,SN65HVD24

SLLS552D − DECEMBER 2002 − REVISED APRIL 2005

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3

DRIVER FUNCTION TABLE

HVD20, HVD21, HVD22

HVD23, HVD24

INPUT

ENABLE

OUTPUTS

INPUT

ENABLE

OUTPUTS

D

DE

A

B

D

DE

A

B

H

H

H

L

H

H

H

L

L

H

L

H

L

H

L

H

X

L

Z

Z

X

L

Z

Z

X

OPEN

Z

Z

X

OPEN

Z

Z

OPEN

H

H

L

OPEN

H

L

H

H = high level, L= low level, X = don’t care, Z = high impedance (off), ? = indeterminate

RECEIVER FUNCTION TABLE

DIFFERENTIAL INPUT

ENABLE

OUTPUT

VID = (VA – VB)

RE

R

0.2 V

≤ VID

L

H

−0.2 V < VID < 0.2 V

L

H (see Note A)

VID ≤ −0.2 V

L

L

X

H

Z

X

OPEN

Z

Open circuit

L

H

Short Circuit

L

H

Idle (terminated) bus

L

H

H = high level, L= low level, Z = high impedance (off)

NOTE A:

If the differential input VID remains within the transition range for

more than 250

µs, the integrated failsafe circuitry detects a bus

fault, and set the receiver output to a high state. See Figure 15.

ABSOLUTE MAXIMUM RATINGS

over operating free-air temperature range unless otherwise noted(1)

SN65HVD2X

Supply voltage(2), VCC

−0.5 V to 7 V

Voltage at any bus I/O terminal

−27 V to 27 V

Voltage input, transient pulse, A and B, (through 100

Ω, see Figure 16)

−60 V to 60 V

Voltage input at any D, DE or RE terminal

−0.5 V to VCC+ 0.5 V

Receiver output current, IO

−10 mA to 10 mA

Human Body Model(3)

A, B, GND

16 kV

Electrostatic discharge

Human Body Model(3)

All pins

5 kV

Electrostatic discharge

Charged-Device Model(4)

All pins

1.5 kV

Machine Model(5)

All pins

200 V

Continuous total power dissipation

See Power Dissipation Rating Table

Junction temperature, TJ

150

°C

(1) Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and

functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not

implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2) All voltage values, except differential I/O bus voltages, are with respect to network ground terminal.

(3) Tested in accordance with JEDEC Standard 22, Test Method A114-A.

(4) Tested in accordance with JEDEC Standard 22, Test Method C101.

(5) Tested in accordance with JEDEC Standard 22, Test Method A115-A.