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SN65HVD24 Datasheet(PDF) 3 Page - Texas Instruments |
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SN65HVD24 Datasheet(HTML) 3 Page - Texas Instruments |
3 / 28 page SN65HVD20,SN65HVD21 SN65HVD22,SN65HVD23,SN65HVD24 SLLS552D − DECEMBER 2002 − REVISED APRIL 2005 www.ti.com 3 DRIVER FUNCTION TABLE HVD20, HVD21, HVD22 HVD23, HVD24 INPUT ENABLE OUTPUTS INPUT ENABLE OUTPUTS D DE A B D DE A B H H H L H H H L L H L H L H L H X L Z Z X L Z Z X OPEN Z Z X OPEN Z Z OPEN H H L OPEN H L H H = high level, L= low level, X = don’t care, Z = high impedance (off), ? = indeterminate RECEIVER FUNCTION TABLE DIFFERENTIAL INPUT ENABLE OUTPUT VID = (VA – VB) RE R 0.2 V ≤ VID L H −0.2 V < VID < 0.2 V L H (see Note A) VID ≤ −0.2 V L L X H Z X OPEN Z Open circuit L H Short Circuit L H Idle (terminated) bus L H H = high level, L= low level, Z = high impedance (off) NOTE A: If the differential input VID remains within the transition range for more than 250 µs, the integrated failsafe circuitry detects a bus fault, and set the receiver output to a high state. See Figure 15. ABSOLUTE MAXIMUM RATINGS over operating free-air temperature range unless otherwise noted(1) SN65HVD2X Supply voltage(2), VCC −0.5 V to 7 V Voltage at any bus I/O terminal −27 V to 27 V Voltage input, transient pulse, A and B, (through 100 Ω, see Figure 16) −60 V to 60 V Voltage input at any D, DE or RE terminal −0.5 V to VCC+ 0.5 V Receiver output current, IO −10 mA to 10 mA Human Body Model(3) A, B, GND 16 kV Electrostatic discharge Human Body Model(3) All pins 5 kV Electrostatic discharge Charged-Device Model(4) All pins 1.5 kV Machine Model(5) All pins 200 V Continuous total power dissipation See Power Dissipation Rating Table Junction temperature, TJ 150 °C (1) Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) All voltage values, except differential I/O bus voltages, are with respect to network ground terminal. (3) Tested in accordance with JEDEC Standard 22, Test Method A114-A. (4) Tested in accordance with JEDEC Standard 22, Test Method C101. (5) Tested in accordance with JEDEC Standard 22, Test Method A115-A. |
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