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PLC18V8Z25D Datasheet(PDF) 10 Page - NXP Semiconductors |
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PLC18V8Z25D Datasheet(HTML) 10 Page - NXP Semiconductors |
10 / 23 page Philips Semiconductors Product specification PLC18V8Z Zero standby power CMOS versatile PAL devices 1997 Aug 08 10 AC ELECTRICAL CHARACTERISTICS4 Commercial = 0 °C ≤ Tamb ≤ +75°C, 4.75V ≤ VCC < 5.25V; Industrial = –40 °C ≤ Tamb ≤ +85°C, 4.5V ≤ VCC ≤ 5.5V; R2 = 390Ω TEST CONDITION1 PLC18V8Z25 (Commercial) PLC18V8ZIA (Industrial) SYMBOL PARAMETER FROM TO R1 (Ω) CL (pF) MIN MAX MIN MAX UNIT Pulse width tCKP Clock period (Minimum tIS + tCKO) CLK + CLK + 200 50 33 33 ns tCKH Clock width High CLK + CLK – 200 50 15 15 ns tCKL Clock width Low CLK – CLK + 200 50 15 15 ns tARW Async reset pulse width I ±, F± I +, F + 25 25 ns Hold time tIH Input or feedback data hold time CLK + Input ± 200 50 0 0 ns Setup time tIS Input or feedback data setup time I ±, F± CLK + 200 50 18 18 ns Propagation delay tPD Delay from input to active output I ±, F± F ± 200 50 25 25 ns tCKO Clock High to output valid access Time CLK + F ± 200 50 15 15 ns tOE13 Product term enable to outputs off I ±, F± F ± Active-High R = 1.5k Active-Low R = 550 50 25 25 ns tOD12 Product term disable to outputs off I ±, F± F ± From VOH R = ∞ From VOL R = 200 5 25 25 ns tOD22 Pin 11 output disable High to outputs off OE – F ± From VOH R = ∞ From VOL R = 200 5 20 20 ns tOE23 Pin 11 output enable to active output OE + F ± Active-High R = 1.5k Active-Low R = 550 50 20 20 ns tARD Async reset delay I ±, F± F + 30 30 ns tARR Async reset recovery time I ±, F± CLK + 20 20 ns tSPR Sync preset recovery time I ±, F± CLK + 20 20 ns tPPR Power-up reset VCC + F + 25 25 ns Frequency of operation fMAX Maximum frequency I/(tIS + tCKO) 200 50 30 30 MHz NOTES: 1. Refer also to AC Test Conditions. (Test Load Circuit) 2. For 3-State output; output enable times are tested with CL = 50pF to the 1.5V level, and S1 is open for high-impedance to High tests and closed for high-impedance to Low tests. Output disable times are tested with CL = 5pF. High-to-High impedance tests are made to an output voltage of VT = (VOH – 0.5V) with S1 open, and Low-to-High impedance tests are made to the VT = (VOL + 0.5V) level with S1 closed. 3. Resistor values of 1.5k and 550 Ω provide 3-State levels of 1.0V and 2.0V, respectively. Output timing measurements are to 1.5V level. 4. Leave all the cells on unused product terms intact (unprogrammed) for all patterns. |
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