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PLS101N Datasheet(PDF) 5 Page - NXP Semiconductors

Part # PLS101N
Description  Programmable logic arrays 16 횞 48 횞 8
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Manufacturer  PHILIPS [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

PLS101N Datasheet(HTML) 5 Page - NXP Semiconductors

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INPUT
F0 – F7
CE
1.5V
1.5V
1.5V
1.5V
1.5V
tPD
tCE
tCD
VOL
VOH
+3.0V
0V
+3.0V
0V
Read Cycle
Philips Semiconductors Programmable Logic Devices
Product specification
PLS100/PLS101
Programmable logic arrays
(16
× 48 × 8)
October 22, 1993
53
AC ELECTRICAL CHARACTERISTICS
0
°C < Tamb < +75°C, 4.75 < VCC < 5.25V, R1 = 470Ω, R2 = 1kΩ
LIMITS
SYMBOL
PARAMETER
TO
FROM
MIN
TYP1
MAX
UNIT
Propagation delay2
tPD
Input
Output
Input
35
50
ns
tCE
Chip Enable3
Output
Chip Enable
15
30
ns
Disable time
tCD
Chip Disable3
Output
Chip Enable
15
30
ns
NOTES:
1. All typical values are at VCC = 5V. Tamb = +25°C.
2. All propagation delays are measured and specified under worst case conditions.
3. For 3-State output; output enable times are tested with CL = 30pF to the 1.5V level, and S1 is open for high-impedance to High tests and
closed for high-impedance to Low tests. Output disable times are tested with CL = 5pF. High-to-High impedance tests are made to an output
voltage of VT = (VOH – 0.5V) with S1 open, and Low-to-High impedance tests are made to the VT = (VOL + 0.5V) level with S1 closed.
VOLTAGE WAVEFORMS
TEST LOAD CIRCUIT
MEASUREMENTS:
All circuit delays are measured at the +1.5V level of in-
puts and outputs, unless otherwise specified.
90%
10%
5ns
5ns
5ns
5ns
90%
10%
+3.0V
+3.0V
0V
0V
tR
tF
Input Pulses
+5V
CL
R1
R2
S1
GND
F7
F0
INPUTS
I0
I15
CE
OUTPUTS
C2
C1
DUT
NOTE:
C1 and C2 are to bypass VCC to GND.
VCC
TIMING DEFINITIONS
SYMBOL
PARAMETER
tCE
Delay between beginning of
Chip Enable Low (with Input
valid) and when Data Output
becomes valid.
tCD
Delay between when Chip
Enable becomes High and
Data Output is in off state
(Hi-Z or High).
tPD
Delay between beginning of
valid Input (with Chip Enable
Low) and when Data Output
becomes valid.
TIMING DIAGRAM


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