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MC33970DW Datasheet(PDF) 8 Page - Freescale Semiconductor, Inc |
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MC33970DW Datasheet(HTML) 8 Page - Freescale Semiconductor, Inc |
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8 / 36 page  Analog Integrated Circuit Device Data 8 Freescale Semiconductor 33970 ELECTRICAL CHARACTERISTICS DYNAMIC ELECTRICAL CHARACTERISTICS Time from Falling Edge of CS to SO Low Impedance (20) tSO(EN) – – 145 ns Time from Rising Edge of CS to SO High Impedance (21) tSO(DIS) – 1.3 4.0 µs Time from Rising Edge of SCLK to SO Data Valid (22) 0.2 VDD ≤ SO ≥ 0.8 VDD, CL = 200 pF tVALID – 65 105 ns Notes 20. Time required for output status data to be terminated at SO. 1.0 k Ω load on SO 21. Time required for output status data to be available for use at SO. 1.0 k Ω load on SO. 22. Time required to obtain valid data out from SO following the rise of SCLK. Table 4. Dynamic Electrical Characteristics Characteristics noted under conditions 4.75 V < VDD < 5.25 V, -40°C < TA < 125°C, GND = 0 V unless otherwise noted. Typical values noted reflect the approximate parameter means at TA = 25°C under nominal conditions unless otherwise noted. Characteristic Symbol Min Typ Max Unit |
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