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A700X107M008ATE012 Datasheet(PDF) 4 Page - Kemet Corporation |
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A700X107M008ATE012 Datasheet(HTML) 4 Page - Kemet Corporation |
4 / 12 page ENVIRONMENTAL 11. Temperature Stability Mounted capacitors withstand extreme temperature testing at a succession or continuous steps at +25°C, -55°C, +25°C, +85°C, +125°C, +25°C in that order. Capacitors are allowed to stabilize at each temperature before measurement. Cap, DF, and DCL are measured at each temperature; except DC Leakage is not measured at -55°C. Table 4 - Acceptable limits are as follows: 12. Standard Life Test • 85°C, Rated Voltage, 2000 Hours Post Test Performance: a. Capacitance: within ±10% of initial value b. DF: within initial limit c. DC Leakage: within initial limit d. ESR: within initial limit 13. High Temperature Life Test • 125°C, Rated Voltage, 2000 Hours Post Test Performance: a. Capacitance: within ±10% of initial value b. DF: within initial limit c. DC Leakage: within 1.25 x initial limit d. ESR: within 2 x initial limit 14. Storage Life Test • 125°C, O VDC, 2000 Hours Post Test Performance: a. Capacitance: within ±10% of initial value b. DF: within initial limit c. DC Leakage: within 1.25 x initial limit d. ESR: within 2 x initial limit 15. Thermal Shock • Mil-Std-202, Method 107, Condition B Minimum temperature is -55°C Maximum temperature is +125°C Post Test Performance: a. Capacitance: within ±10% of initial value b. DF: within initial limit c. DC Leakage: within initial limit d. ESR: within 2 x initial limit 16. Moisture Sensitivity Level (MSL) • J-Std-020 a. Capacitance: within ±30% of initial value b. DF: within initial limit c. DC Leakage: within initial limit d. ESR: within 2 x initial limit Meets MSL 3 requirements for SnPb assembly. 17. Load Humidity • 85°C, 85% RH, Rated Voltage, 500 Hours a. Capacitance: within +30/-5% of initial value b. DF: within initial limit c. DC Leakage: within 5 x initial limit d. ESR: within 2 x initial limit 18. ESD • Polymer Aluminum capacitors are not sensi- tive to Electro-Static Discharge (ESD). 19. Failure Mechanism and Reliability The normal failure mechanism is dielectric break down. Dielectric failure can result in high DC Leakage current and may proceed to the level of a short circuit. With sufficient time to charge, healing may occur by one of two potential mechanisms. The polymer adjacent to the dielectric fault site may over- heat and vaporize, disconnecting the fault site from the circuit. The polymer may also oxidize into a more resistive material that caps the defect site in the dielectric and reduces the flow of current. Capacitor failure may be induced by exceeding the rated conditions of forward DC voltage, reverse DC voltage, surge current, power dissipation or tempera- ture. Excessive environmental stress, such as pro- longed or high temperature reflow processes may also trigger dielectric failure. 20. Resistance to Solvents • Mil-Std 202, Method 215 Post Test Performance: a. Capacitance: within ±10% of initial value b. DF: within initial limit c. DC Leakage: within initial limit d. ESR: within initial limit e. Physical: no degradation of case, terminals or marking 21. Fungus • Mil-Std-810, Method 508 22. Flammability • UL94 VO Classification Step Temp ∆∆Cap DCL DF 1 25°C Specified Tolerance Catalog Limit Catalog Limit 2 -55°C 15% of initial value N/A Catalog Limit 3 +25°C 5% of initial value Catalog Limit Catalog Limit 4 +85°C 15% of initial value 2X Catalog Limit Catalog Limit 5 +125°C 20% of initial value 2X Catalog Limit Catalog Limit 6 +25°C 5% of initial value Catalog Limit Catalog Limit ©KEMET Electronics Corporation, P.O. Box 5928, Greenville, S.C. 29606, (864) 963-6300 ALUMINUM ORGANIC CAPACITORS Performance Characteristics 61 |
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