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MAX211IDBG4 Datasheet(PDF) 5 Page - Texas Instruments |
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MAX211IDBG4 Datasheet(HTML) 5 Page - Texas Instruments |
5 / 20 page MAX211 5V MULTICHANNEL RS232 LINE DRIVER/RECEIVER WITH ±15kV ESD PROTECTION SLLS567E − MAY 2003 − REVISED JANUARY 2004 5 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 DRIVER SECTION electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Note 4 and Figure 4) PARAMETER TEST CONDITIONS MIN TYP† MAX UNIT VOH High-level output voltage DOUT at RL = 3 kΩ to GND 5 9 V VOL Low-level output voltage DOUT at RL = 3 kΩ to GND −5 −9 V IIH Driver high-level input current DIN = VCC 15 200 A IIH Control high-level input current EN, SHDN = VCC 3 10 µA IIL Driver low-level input current DIN = 0 V −15 −200 A IIL Control low-level input current EN, SHDN = 0 V −3 −10 µA IOS‡ Short-circuit output current VCC = 5.5 V, VO = 0 V ±10 ±60 mA ro Output resistance VCC, V+, and V− = 0 V, VO = ±2 V 300 W † All typical values are at VCC = 5 V, and TA = 25°C. ‡ Short-circuit durations should be controlled to prevent exceeding the device absolute power dissipation ratings, and not more than one output should be shorted at a time. NOTE 4: Test conditions are C1−C4 = 0.1 µF at VCC = 5 V ± 0.5 V. switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Note 4) PARAMETER TEST CONDITIONS MIN TYP† MAX UNIT Maximum data rate CL = 50 pF to 1000 pF, One DOUT switching, RL = 3 kΩ to 7 kΩ, See Figure 2 120 kbit/s tPLH (D) Propagation delay time, low- to high-level output CL = 2500 pF, All drivers loaded, RL = 3 kΩ, See Figure 2 2 µs tPHL (D) Propagation delay time, high- to low-level output CL = 2500 pF, All drivers loaded, RL = 3 kΩ, See Figure 2 2 µs tsk(p) Pulse skew§ CL = 150 pF to 2500 pF, RL = 3 kΩ to 7 kΩ, See Figure 3 300 ns SR(tr) Slew rate, transition region (see Figure 2) CL = 50 pF to 1000 pF, VCC = 5 V RL = 3 kΩ to 7 kΩ, 3 6 30 V/ µs † All typical values are at VCC = 5 V, and TA = 25°C. § Pulse skew is defined as |tPLH − tPHL| of each channel of the same device. NOTE 4: Test conditions are C1−C4 = 0.1 µF at VCC = 5 V ± 0.5 V. ESD protection PIN TEST CONDITIONS TYP UNIT DOUT, RIN Human-Body Model ±15 kV |
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