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C410C479K2U5CA Datasheet(PDF) 4 Page - Kemet Corporation |
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C410C479K2U5CA Datasheet(HTML) 4 Page - Kemet Corporation |
4 / 48 page CERAMIC CONFORMALLY COATED/AXIAL & RADIAL PERFORMANCE CHARACTERISTICS FOR STANDARD AND HIGH VOLTAGE © KEMET Electronics Corporation, P.O. Box 5928, Greenville, S.C. 29606, (864) 963-6300 4 GENERAL SPECIFICATIONS Working Voltage: Axial (WVDC) Radial (WVDC) C0G – 50 & 100 50, 100, 200, 500, 1k, 1.5k, 2k, 2.5k, 3k X7R – 50 & 100 50, 100, 200, 500, 1k, 1.5k, 2k, 2.5k, 3k Z5U – 50 & 100 50 & 100 Temperature Characteristics: C0G – 0 ± 30 PPM / °C from - 55°C to + 125°C (1) X7R – ± 15% from - 55°C to + 125°C Z5U – + 22% / -56% from + 10°C to + 85°C Capacitance Tolerance: C0G – ±0.5pF, ±1%, ±2%, ±5%, ±10% X7R – ±10%, ±20%, +80% / -20%, +100% / -0% Z5U – ±20%, +80% / -20% Construction: Epoxy encapsulated - meets flame test requirements of UL Standard 94V-0. High-temperature solder - meets EIA RS-198, Method 302, Condition B (260°C for 10 seconds) Lead Material: 100% matte tin (Sn) with nickel (Ni) underplate and steel core. Solderability: EIA RS-198, Method 301, Solder Temperature: 230°C ±5°C. Dwell time in solder = 7 ± ½ seconds. Terminal Strength: EIA RS-198, Method 303, Condition A (2.2kg) ELECTRICAL Capacitance @ 25°C: Within specified tolerance and following test conditions. C0G – > 1000pF with 1.0 vrms @ 1 kHz £ 1000pF with 1.0 vrms @ 1 MHz X7R – with 1.0 vrms @ 1 kHz Z5U – with 1.0 vrms @ 1 kHz Dissipation Factor @ 25°C: Same test conditions as capacitance. C0G – 0.15% maximum X7R – 2.5% maximum Z5U – 4.0% maximum Insulation Resistance @ 25°C: EIA RS-198, Method 104, Condition A <1kV C0G – 100k Megohm or 1000 Megohm x µF, whichever is less. £500V test @ rated voltage, ³1kV test @ 500V X7R – 100k Megohm or 1000 Megohm x µF, whichever is less. £500V test @ rated voltage, ³1kV test @ 500V Z5U – 10k Megohm or 1000 Megohm x µF, whichever is less. Dielectric Withstanding Voltage: EIA RS-198, Method 103 £200V test @ 250% of rated voltage for 5 seconds with current limited to 50mA. 500V test @ 150% of rated voltage for 5 seconds with current limited to 50mA. ³1000V test @ 120% of rated voltage for 5 seconds with current limited to 50mA. ENVIRONMENTAL Vibration: EIA RS-198, Method 304, Condition D (10-2000Hz; 20g) Shock: EIA RS-198, Method 305, Condition I (100g) Life Test: EIA RS-198, Method 201, Condition D. ££ 200V C0G – 200% of rated voltage @ +125°C X7R – 200% of rated voltage @ +125°C Z5U – 200% of rated voltage @ +85°C ³³ 500V C0G – rated voltage @ +125°C X7R – rated voltage @ +125°C Post Test Limits @ 25°C are: Capacitance Change: C0G ( £ 200V) – +3% or 0.25pF, whichever is greater. C0G ( ³ 500V) – +3% or 0.50pF, whichever is greater. X7R – + 20% of initial value (2) Z5U – + 30% of initial value (2) Dissipation Factor: C0G – 0.15% maximum X7R – 2.5% maximum Z5U – 4.0% maximum Insulation Resistance: C0G – 10k Megohm or 100 Megohm x µF, whichever is less. ³1kV tested @ 500V. X7R – 10k Megohm or 100 Megohm x µF, whichever is less. ³1kV tested @ 500V. Z5U – 1k Megohm or 100 Megohm x µF, whichever is less. Moisture Resistance: EIA RS-198, Method 204, Condition A (10 cycles without applied voltage.) Post Test Limits @ 25°C are: Capacitance Change: C0G ( £ 200V) – +3% or 0.25pF, whichever is greater. C0G ( ³ 500V) – +3% or 0.50pF, whichever is greater. X7R – + 20% of initial value (2) Z5U – + 30% of initial value (2) Dissipation Factor: C0G – 0.25% maximum X7R – 3.0% maximum Z5U – 4.0% maximum Insulation Resistance: C0G – 10k Megohm or 100 Megohm x µF, whichever is less. £500V test @ rated voltage, ³1kV test @ 500V. X7R – 10k Megohm or 100 Megohm x µF, whichever is less. ³500V test @ rated voltage, >1kV test @ 500V. Z5U – 1k Megohm or 100 Megohm x µF, whichever is less. Thermal Shock: EIA RS-198, Method 202, Condition B (C0G & X7R: -55°C to +125°C); Condition A (Z5U: -55°C to 85°C) (1)+53 PPM -30 PPM/ °C from +25°C to -55°C, + 60 PPM below 10pF. (2)X7R and Z5U dielectrics exhibit aging characteristics; there- fore, it is highly recommended that capacitors be deaged for 2 hours at 150°C and stabilized at room temperature for 48 hours before capacitance measurements are made. |
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