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MCP1541 Datasheet(PDF) 4 Page - Microchip Technology |
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MCP1541 Datasheet(HTML) 4 Page - Microchip Technology |
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4 / 20 page  MCP1525/41 DS21653B-page 4 © 2005 Microchip Technology Inc. 1.1.4 DROPOUT VOLTAGE The dropout voltage of these devices is measured by reducing VIN to the point where the output drops by 1%. Under these conditions the dropout voltage is equal to: EQUATION 1-2: The dropout voltage is affected by ambient temperature and load current. In Figure 2-18, the dropout voltage is shown over a negative and positive range of output current. For currents above zero milliamps, the dropout voltage is positive. In this case, the voltage reference is primarily powered by VIN. With output currents below zero milliamps, the dropout voltage is negative. As the output current becomes more negative, the input current (IIN) reduces. Under this condition, the output current begins to provide the needed power to the voltage reference. 1.1.5 LINE REGULATION Line regulation is a measure of the change in output voltage (VOUT) as a function of a change in the input voltage (VIN). This is expressed as ΔVOUT/ΔVIN and is measured in either µV/V or ppm. For example, a 1 µV change in VOUT caused by a 500 mV change in VIN would net a ΔVOUT/ΔVIN of 2 µV/V, or 2 ppm. 1.1.6 LOAD REGULATION ( ΔVOUT/ΔIOUT) Load regulation is a measure of the change in the output voltage (VOUT) as a function of the change in output current (IOUT). Load regulation is usually measured in mV/mA. 1.1.7 INPUT CURRENT The input current (operating current) is the current that sinks from VIN to VSS without a load current on the out- put pin. This current is affected by temperature and the output current. 1.1.8 INPUT VOLTAGE REJECTION RATIO The Input Voltage Rejection Ratio (IVRR) is a measure of the change in output voltage versus the change in input voltage over frequency, as shown in Figure 2-7. The calculation used for this plot is: EQUATION 1-3: 1.1.9 LONG-TERM OUTPUT STABILITY The long-term output stability is measured by exposing the devices to an ambient temperature of 125°C (Figure 2-9) while configured in the circuit shown in Figure 1-1. In this test, all electrical specifications of the devices are measured periodically at +25°C. FIGURE 1-1: Dynamic Life Test Configuration. 1.1.10 OUTPUT VOLTAGE HYSTERESIS The output voltage hysteresis is a measure of the output voltage error once the powered devices are cycled over the entire operating temperature range. The amount of hysteresis can be quantified by measuring the change in the +25°C output voltage after temperature excursions from +25°C to +85°C to +25°C and also from +25°C to -40°C to +25°C. V DROP V IN V OUT – = IVRR 20 V IN V OUT ------------- log dB () = VSS VOUT VIN CL VIN =5.5V RL ±2 mA square wave @10 Hz MCP1525 MCP1541 1µF |
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