25AA256/25LC256

DS21822F-page 4

© 2007 Microchip Technology Inc.

TABLE 1-3:

AC TEST CONDITIONS

18

HOLD Low to Output

High-Z

30

60

160

—

—

—

ns

ns

ns

4.5V

≤ Vcc ≤ 5.5V (Note 1)

2.5V

≤ Vcc < 4.5V (Note 1)

1.8V

≤ Vcc < 2.5V (Note 1)

19

HOLD High to Output

Valid

30

60

160

—

—

—

ns

ns

ns

4.5V

≤ Vcc ≤ 5.5V

2.5V

≤ Vcc < 4.5V

1.8V

≤ Vcc < 2.5V

20

Internal Write Cycle

Time

—5

ms

(NOTE 2)

21

—

Endurance

1M

—

E/W

Cycles

(NOTE 3)

TABLE 1-2:

AC CHARACTERISTICS (CONTINUED)

AC CHARACTERISTICS

Industrial (I):

Param.

No.

Sym.

Characteristic

Min.

Max.

Units

Test Conditions

Note 1: This parameter is periodically sampled and not 100% tested.

is complete.

3: This parameter is not tested but ensured by characterization. For endurance estimates in a specific

application, please consult the Total Endurance™ Model which can be obtained from Microchip’s web site

at www.microchip.com.

AC Waveform:

—

(Note 1)

(Note 2)

—

Timing Measurement Reference Level

Input

Output

≤ 4.0V