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GSC93BC56 Datasheet(PDF) 1 Page - GTM CORPORATION |
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GSC93BC56 Datasheet(HTML) 1 Page - GTM CORPORATION |
1 / 8 page GSC93BC46/56/66 Page: 1/8 ISSUED DATE :2006/06/14 REVISED DATE : G G S S C C 9933B B C C 4466//5566//6666 3 - w i r e S e r i a l E E P R O M s 1 K / 2 K / 4 K Description The GSC93BC family provides 1K, 2K and 4K of serial electrically erasable and programmable read-only memory (EEPROM). The wide Vdd range allows for low-voltage operation down to 1.8V and up to 5.5V. The device, fabricated using traditional CMOS EEPROM technology, is optimized for many industrial and commercial applications where low-voltage and low-power operation is essential. The device is accessed via a 3-wire serial interface. Features &Internally organized as 128x8 or 64x16 (1K), 256x8 or 128x16 (2K), 512x8 or 256x16 (4K) &Wide-voltage range operation: 1.8V~5.5V &3-wire serial interface bus &Date retention: 100years &High endurance: 1,000,000 Write Cycles &2MHz (5V) clock rate &Sequential read operation &Self-timed write cycle (10ms max) ‡ Package Dimensions Millimeter Millimeter REF. Min. Max. REF. Min. Max. A 5.80 6.20 M 0.10 0.25 B 4.80 5.00 H 0.35 0.49 C 3.80 4.00 L 1.35 1.75 D 0° 8° J 0.375 REF. E 0.40 0.90 K 45° F 0.19 0.25 G 1.27 TYP. Figure 1. Pin Configurations Pin Name Function CS Chip Select SK Serial Data Clock DI Serial Data Input DO Serial Data Output Gnd Ground Vcc Power Supply ORG Internal Organization NC No Connect Absolute Maximum Ratings Parameter Ratings Unit Voltage on Any Pin with Respect to Ground -1.0 to Vcc +7.0 V Maximum Operating Voltage 6.25 V DC Output Current 5.0 mA Operating Temperature Range -55 ~ +125 : Storage Temperature Range -65 ~ +150 : Note: Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of these specifications are not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. |
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