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PACKAGE DISSIPATION RATINGS

ABSOLUTE MAXIMUM RATINGS

SN65HVD05

,, SN65HVD06

SN75HVD05, SN65HVD07

SN75HVD06, SN75HVD07

SLLS533D – MAY 2002 – REVISED JULY 2006

These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

MARKED AS

DRIVER

PLASTIC

SMALL

SIGNALING

UNIT

OUTPUT SLOPE

DUAL-IN-LINE

OUTLINE

RATE

LOAD

CONTROL

PACKAGE

IC (SOIC)

(PDIP)

PACKAGE

40 Mbps

1/2

No

SN65HVD05D

SN65HVD05P

65HVD05

VP05

10 Mbps

1/8

Yes

40°C to 85°C

SN65HVD06D

SN65HVD06P

65HVD06

VP06

1 Mbps

1/8

Yes

SN65HVD07D

SN65HVD07P

65HVD07

VP07

40 Mbps

1/2

No

SN75HVD05D

SN75HVD05P

75HVD05

VN05

10 Mbps

1/8

Yes

0°C to 70°C

SN75HVD06D

SN75HVD06P

75HVD06

VN06

1 Mbps

1/8

Yes

SN75HVD07D

SN75HVD07P

75HVD07

VN07

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

(2)

The D package is available taped and reeled. Add an R suffix to the device type (i.e., SN65HVD05DR).

(See Figure 12 and Figure 13)

PACKAGE

POWER RATING

POWER RATING

POWER RATING

710 mW

5.7 mW/°C

455 mW

369 mW

1282 mW

10.3 mW/°C

821 mW

667 mW

P

1000 mW

8.0 mW/°C

640 mW

520 mW

(1)

This is the inverse of the junction-to-ambient thermal resistance when board-mounted and with no air flow.

(2)

Tested in accordance with the Low-K thermal metric definitions of EIA/JESD51-3

(3)

Tested in accordance with the High-K thermal metric definitions of EIA/JESD51-7

SN65HVD05, SN65HVD06, SN65HVD07

SN75HVD05, SN75HVD06, SN75HVD07

-0.3 V to 6 V

Voltage range at A or B

-9 V to 14 V

Input voltage range at D, DE, R or RE

Voltage input range, transient pulse, A and B, through 100

Ω (see Figure 11)

-50 V to 50 V

–11 mA to 11mA

A, B, and GND

16 kV

Electrostatic discharge

All pins

4 kV

All pins

1 kV

Continuous total power dissipation

See Dissipation Rating Table

(1)

Stresses beyond those listed under "absolute maximum ratings” may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under" recommended operating

conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

All voltage values, except differential I/O bus voltages, are with respect to network ground terminal.

(3)

Tested in accordance with JEDEC Standard 22, Test Method A114-A.

(4)

Tested in accordance with JEDEC Standard 22, Test Method C101.

2

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