P4C1048L-100PI datasheet(7/12 Pages) PYRAMID

Part #	P4C1048L-100PI

Description	LOW POWER 512K x 8 CMOS STATIC RAM

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Manufacturer	PYRAMID [Pyramid Semiconductor Corporation]

Direct Link	http://www.pyramidsemiconductor.com

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7 / 12 page

P4C1048L

Page 7 of 12

Document # SRAM129 REV D

Write

Active

Read

TIMING WAVEFORM OF WRITE CYCLE NO.2 (

CE

CE CONTROLLED)(6)

* including scope and test fixture.

Note:

Because of the high speed of the P4C1048L, care must be taken when

testing this device; an inadequate setup can cause a normal functioning

part to be rejected as faulty. Long high-inductance leads that cause

supply bounce must be avoided by bringing the V

CC and ground planes

directly up to the contactor fingers. A 0.01 µF high frequency capacitor

is also required between V

CC and ground.

To avoid signal reflections, proper termination must be used; for example,

a 50

Ω test environment should be terminated into a 50Ω load with 1.77V

(Thevenin Voltage) at the comparator input, and a 589

Ω resistor must be

used in series with D

OUT to match 639Ω (Thevenin Resistance).

AC TEST CONDITIONS

TRUTH TABLE

Input Pulse Levels

Input Rise and Fall Times

Input Timing Reference Level

Output Timing Reference Level

Output Load

GND to 3.0V

3ns

1.5V

See Fig. 1 and 2

Mode

Standby

D

OUT Disabled

Standby

Power

I/O

WE

OE

CE

High Z

D

OUT

D

IN

X

H

L

X

H

L

X

H

L

Active

High Z

Figure 1. Output Load

Figure 2. Thevenin Equivalent

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P4C1048L-100PI Datasheet(PDF) 7 Page - Pyramid Semiconductor Corporation

P4C1048L-100PI Datasheet(HTML) 7 Page - Pyramid Semiconductor Corporation

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