6.42

IDT7016S/L

High-Speed 16K x 9 Dual-Port Static RAM

Military, Industrial and Commercial Temperature Ranges

10

APRIL 04, 2006

NOTES:

1. R/

W or CE must be HIGH during all address transitions.

CE and a LOW R/W for memory array writing cycle.

CE or R/W (or SEM or R/W) going HIGH to the end of write cycle.

4. During this period, the I/O pins are in the output state and input signals must not be applied.

5. If the

CE or SEM LOW transition occurs simultaneously with or after the R/W LOW transition, the outputs remain in the High-impedance state.

6. Timing depends on which enable signal is asserted last,

CE or R/W.

7. This parameter is guaranteed by device characterization but is not production tested. Transition is measured 0mV from steady state with the Output Test Load (Figure

2).

8. If

OE is HIGH during an R/W controlled write cycle, this requirement does not apply and the write pulse can be as short as

9. To access RAM,

R/

W

(2)

OE

ADDRESS

CE or SEM

(6)

(4)

(4)

(3)

3190 drw 09

(7)

(9)

(7)

3190 drw 10

ADDRESS

CE or SEM

R/

W

(3)

(2)

(6)

(9)