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UXB02070H3AR200 Datasheet(PDF) 6 Page - Vishay Siliconix

Part # UXB02070H3AR200
Description  High Precision Leaded Resistors
Download  9 Pages
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Manufacturer  VISHAY [Vishay Siliconix]
Direct Link  http://www.vishay.com
Logo VISHAY - Vishay Siliconix

UXB02070H3AR200 Datasheet(HTML) 6 Page - Vishay Siliconix

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Document Number: 28726
For technical questions, contact: ff3cresistors@vishay.com
www.vishay.com
Revision: 21-Aug-07
89
UXA 0204, UXB 0207, UXE 0414
High Precision Leaded Resistors
Vishay Beyschlag
TESTS AND REQUIREMENTS
Essentially all tests are carried out in accordance with the
following specifications:
EN 140000/IEC 60115-1, Generic specification (includes
tests)
EN 140100/IEC 60115-2, Sectional specification (includes
schedule for qualification approval)
CECC 40101-806, Detail specification (includes schedule for
conformance inspection)
Most of the components are approved in accordance with the
European CECC-system, where applicable. The Test
Procedures and Requirements table contains only the most
important tests. For the full test schedule refer to the
documents listed above. The testing also covers most of the
requirements specified by EIA/IS-703 and JIS-C-5202.
The tests are carried out in accordance with IEC 60 068 and
under standard atmospheric conditions in accordance with
IEC 60068-1, 5.3. Climatic category LCT/UCT/56 (rated
temperature range: Lower Category Temperature, Upper
Category Temperature; damp heat, long term, 56 days) is
valid.
Unless otherwise specified the following values apply:
Temperature: 15 °C to 35 °C
Relative humidity: 45 % to 75 %
Air pressure: 86 kPa to 106 kPa (860 mbar to 1060 mbar).
For testing the components are mounted on a test board in
accordance with IEC 60115-1, 4.31 unless otherwise
specified.
In the Test Procedures and Requirements table only the
tests and requirements are listed with reference to the
relevant clauses of IEC 60115-1 and IEC 60068-2; a short
description of the test procedure is also given.
TEST PROCEDURES AND REQUIREMENTS
IEC
60115-1
CLAUSE
IEC
60068-2
TEST
METHOD
TEST
PROCEDURE
REQUIREMENTS
PERMISSIBLE CHANGE (
ΔR)
Stability for product
types:
UXA 0204
100
Ω to 100 kΩ
22
Ω to < 100 Ω;
> 100 k
Ω to 221 kΩ
-
UXB 0207
100
Ω to 250 kΩ
40.2
Ω to < 100 Ω;
> 250 k
Ω to 301 kΩ
10
Ω to < 40.2 Ω;
> 301 k
Ω to 1 MΩ
UXE 0414
100
Ω to 100 kΩ
22
Ω to < 100 Ω;
> 100 k
Ω to 511 kΩ
-
4.5
-
resistance
(
ΔR/R)
± 0.25 %; ± 0.1 %; ± 0.05 %; ± 0.01 %
4.8.4.2
-
temperature
coefficient
at 20/LCT/20
°C and
20/UCT/20
°C
± 10 ppm/K; ± 05 ppm/K; ± 02 ppm/K
4.25.1
-
endurance
room temperature;
U =
or
U = Umax;
1.5 h on; 0.5 h off
70 °C; 2000 h
± (0.05 %
R + 0.01
Ω) ± (0.05 % R + 0.01 Ω) ± (0.05 % R +0.01 Ω)
85 °C; 1000 h
± (0.02 %
R + 0.01
Ω) ± (0.03 % R + 0.01 Ω)± (0.04 % R +0.01 Ω)
85 °C; 8000 h
± (0.04 %
R + 0.01
Ω) ± (0.06 % R + 0.01 Ω)± (0.08 % R +0.01 Ω)
P
70 x R


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