BurrBrown Products

from Texas Instruments

PCM4220

FEATURES

APPLICATIONS

PCM4220

SBAS407A – DECEMBER 2006 – REVISED MAY 2007

High-Performance, Two-Channel, 24-Bit, 216kHz Sampling

Multi-Bit Delta-Sigma Analog-to-Digital Converter

• Digital High-Pass Filtering Removes DC Offset

• Supports Linear PCM Output Data

–

Left and Right Channel Filters May Be

Disabled Independently

–

Output Sampling Rates from 8kHz to

216kHz

• Audio Serial Port Interface

• Differential Voltage Inputs

–

Master or Slave Mode Operation

• On-Chip Voltage Reference Improves

–

Power-Supply Noise Rejection

Formats

• Dynamic Performance (24-bit word length)

• Output Word Length Reduction

–

Dynamic Range (–60dB input, A-weighted):

• Overflow Indicators for the Left and Right

123dB typical

Channels

–

Dynamic Range (–60dB input, 20kHz

• Analog Power Supply:

bandwidth): 121dB typical

+4.0V nominal

–

Total Harmonic Distortion + Noise

• Digital Power Supply:

(–1dB input, 20kHz bandwidth):

+3.3V nominal

–108dB typical

• Power-Down Mode: 4mW typical

–

Channel Separation: 135dB

• Package: TQFP-48, RoHS compliant

• Low Power Dissipation:

–

305mW typical for 48kHz sampling rate

• Digital Audio Recorders and

–

330mW typical for 96kHz sampling rate

Mixing Desks

–

340mW typical for 192kHz sampling rate

• Digital Live Sound Consoles

• Linear Phase Digital Decimation Filtering

• Digital Audio Effects Processors

–

Select from Classic or Low Group Delay

• Surround Sound Encoders

Filter Responses

• Broadcast Studio Equipment

–

Low Passband Ripple

• Data Acquisition and

Classic:

±0.00015dB

Measurement Systems

Low Group Delay:

±0.001dB

• Audio Test Systems

• Sonar

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Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

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PRODUCTION DATA information is current as of publication date.

Copyright © 2006–2007, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.