Maximum Ratings
DC Electrical Characteristics
Symbol
Description
Test Conditions
Min
Typ
Max
Unit
VOH
Output High voltage
Vcc=3V Vin=VIH or VIL, IOH= -12mA
2.4
3
-
V
VOL
Output Low voltage
Vcc=3V Vin=VIH or VIL, IOH=12mA
-
0.4
0.5
V
VIH
Input High voltage
Guaranteed Logic HIGH Level (Input Pin)
2
-
5.5
V
VIL
Input Low voltage
Guaranteed Logic LOW Level (Input Pin)
-0.5
-
0.8
V
IIH
Input High current
Vcc = 3.6V and Vin = 5.5V
IIL
Input Low current
Vcc = 3.6V and Vin = 0V
-
-
-50
uA
-
-
50
uA
VIK
Clamp diode voltage
Vcc = Min. And
IIN = -18mA
-
-0.7
-1.2
V
Notes:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2.
Typical values are at Vcc = 3.3V, 25 °C ambient.
3.
This parameter is guaranteed but not tested.
4.
Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
5.
VoH = Vcc – 0.6V at rated current
Description
Max
Unit
Storage Temperature
-65 to 150
°C
Operation Temperature
-40 to 85
°C
Operation Voltage
-0.5 to +4.6
V
Input Voltage
-0.5 to +5.5
V
Output Voltage
-0.5 to Vcc+0.5
V
Note:
stresses greater than listed under
Maximum
Ratings
may
cause
permanent damage to the device. This
is a stress rating only and functional
operation of the device at these or any
other conditions above those indicated
in the operational sections of this
specification is not implied. Exposure
to absolute maximum rating conditions
for extended periods may affect
reliability specification is not implied.
07/31/06
3.3V 1:4 CMOS Clock Buffered Driver
Copyright © 2005-2006, Potato Semiconductor Corporation
2
PO74G304A
700MHz TTL/CMOS Potato Chip
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