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R1152N116B Datasheet(PDF) 7 Page - RICOH electronics devices division |
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R1152N116B Datasheet(HTML) 7 Page - RICOH electronics devices division |
7 / 21 page R1152N 7 TEST CIRCUITS VIN CE GND EXT VOUT VIN OUT CIN COUT PNP Tr VIN CE GND EXT VOUT VIN VOUT ISS Fig.1 Standard test Circuit CIN =0.1µF, COUT=10µF Fig.2 Supply Current Test Circuit VIN CE GND EXT VOUT COUT OUT PNP Tr P.G. IOUT VIN CE GND EXT VOUT COUT OUT PNP Tr I1 I2 CIN VIN Fig.3 Ripple Rejection, Line Transient Response Fig.4 Load Transient Response Test Circuit Test Circuit COUT =10µF CIN =0.1µF, COUT=10µF TYPICAL APPLICATIONS VIN CE GND EXT VOUT CIN OUT COUT PNP Tr IN VIN CE GND EXT VOUT COUT PNP Tr OUT CIN IN Fixed Type Output Adjustable Output (External Components) CIN =0.1µF, COUT=10µF |
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