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ABSOLUTE MAXIMUM RATINGS

(1)

OPA376

OPA2376

OPA4376

SBOS406B – JUNE 2007 – REVISED SEPTEMBER 2007

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

OPA376, OPA2376, OPA4376

UNIT

Supply Voltage

+7

V

–0.5 to (V+) + 0.5

V

Signal Input Terminals

±10

mA

Continuous

Operating Temperature

–40 to +150

°C

Storage Temperature

–65 to +150

°C

Junction Temperature

+150

°C

Human Body Model

4000

V

ESD Rating

Charged Device Model

1000

V

Machine Model

200

V

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not supported.

(2)

Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5V beyond the supply rails should

be current limited to 10mA or less.

(3)

Short-circuit to ground one amplifier per package.

PRODUCT

PACKAGE-LEAD

PACKAGE DESIGNATOR

PACKAGE MARKING

SC70-5

DCK

BUR

OPA376

SOT23-5

DBV

BUQ

SO-8

D

OPA376

OPA2376

SO-8

D

OPA2376

OPA2376

MSOP-8

DGK

OBBI

OPA4376

TSSOP-14

PW

OPA4376

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

2

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Copyright © 2007, Texas Instruments Incorporated

Product Folder Link(s): OPA376 OPA2376 OPA4376