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CAT93C76LE-T2 Datasheet(PDF) 2 Page - Catalyst Semiconductor |
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CAT93C76LE-T2 Datasheet(HTML) 2 Page - Catalyst Semiconductor |
2 / 13 page CAT93C76 (Rev. A) Doc. No. MD-1090 Rev. B 2 © Catalyst Semiconductor, Inc. Characteristics subject to change without notice ABSOLUTE MAXIMUM RATINGS (1) Parameters Ratings Units Temperature Under Bias –55 to +125 ºC Storage Temperature –65 to 150 ºC Voltage on any Pin with Respect to Ground (2) -2.0 to +VCC +2.0 V VCC with Respect to Ground -2.0 to +7.0 V Lead Soldering Temperature (10 seconds) 300 ºC Output Short Circuit Current (3) 100 mA RELIABILITY CHARACTERISTICS (3) Symbol Parameter Reference Test Method Min Units NEND (4) Endurance MIL-STD-883, Test Method 1033 1,000,000 Cycles/Byte TDR (4) Data Retention MIL-STD-883, Test Method 1008 100 Years VZAP (4) ESD Susceptibility MIL-STD-883, Test Method 3015 2000 V ILTH (4)(5) Latch-Up JEDEC Standard 17 100 mA D.C. OPERATING CHARACTERISTICS VCC = +1.8V to +5.5V unless otherwise specified. Symbol Parameter Test Conditions Min Typ Max Units ICC1 Power Supply Current (Write) fSK = 1MHz; VCC = 5.0V 1 3 mA ICC2 Power Supply Current (Read) fSK = 1MHz; VCC = 5.0V 300 500 µA ISB1 Power Supply Current (Standby) (x8 Mode) CS = 0V ORG = GND 2 10 µA ISB2 Power Supply Current (Standby) (x16Mode) CS = 0V ORG = Float or VCC 0 (6) 10 µA ILI Input Leakage Current VIN = 0V to VCC 0 (6) 10 µA ILO Output Leakage Current VOUT = 0V to VCC, CS = 0V 0 (6) 10 µA ILORG ORG Pin Leakage Current ORG = GND or ORG = VCC 1 10 µA VIL1 Input Low Voltage 4.5V ≤ VCC ≤ 5.5V -0.1 0.8 V VIH1 Input High Voltage 4.5V ≤ VCC ≤ 5.5V 2 VCC + 1 V VIL2 Input Low Voltage 1.8V ≤ VCC < 4.5V 0 VCC x 0.2 V VIH2 Input High Voltage 1.8V ≤ VCC < 4.5V VCC x 0.7 VCC + 1 V VOL1 Output Low Voltage 4.5V ≤ VCC ≤ 5.5V; IOL = 2.1mA 0.4 V VOH1 Output High Voltage 4.5V ≤ VCC ≤ 5.5V; IOH = -400µA 2.4 V VOL2 Output Low Voltage 1.8V ≤ VCC < 4.5V; IOL = 100µA 0.1 V VOH2 Output High Voltage 1.8V ≤ VCC < 4.5V; IOH = -100µA VCC - 0.2 V Notes: (1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability. (2) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20ns. Maximum DC voltage on output pins is VCC +0.5V, which may overshoot to VCC +2.0V for periods of less than 20ns. (3) Output shorted for no more than one second. (4) These parameters are tested initially and after a design or process change that affects the parameter. (5) Latch-up protection is provided for stresses up to 100 mA on I/O pins from –1V to VCC +1V. (6) 0µA is defined as less than 900nA. |
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