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AK2573A Datasheet(PDF) 6 Page - Asahi Kasei Microsystems

Part # AK2573A
Description  125M / 156M Laser Diode Driver APC
Download  38 Pages
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Manufacturer  AKM [Asahi Kasei Microsystems]
Direct Link  http://www.akm.com
Logo AKM - Asahi Kasei Microsystems

AK2573A Datasheet(HTML) 6 Page - Asahi Kasei Microsystems

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ASAHI KASEI
[AK2573A]
<MS0189-E-01>
-6-
2004/5
.AbsoluteMaximumRating
Item
Symbol
Min
Max
Unit
Remarks
SupplyVoltage
VDD
-0.3
6.0
V
GND
VSS
0.0
0.0
V
ReferenceVoltage
Inputvoltage
VIN
-0.3
VDD+0.3
V
ExceptVDD
InputCurrent
IIN
-10
10
mA
ExceptVDD
StorageTemperature
TSTG
-55
130
°C
Note1
Stressbeyond“AbsoluteMaximumRange”maycausepermanentdamagetothedevice.
Note1: ExceptDataretention. Dataretentionisprescribedatsection-Ⅳ(2)EEPROM.
.RecommendedOperationConditions
Item
Symbol
Min
Typ
Max
Unit
Remarks
OperatingAmbient
Ta1
-40
85
°C
VDD1
3.1
3.3
3.5
V
ExceptAVDD
VDD2
3.0
3.3
3.5
V
AVDD
PowerSupply
VSS
0.0
0.0
0.0
V
ReferenceVoltage
.ElectricalCharacteristics
1. PowerConsumption
Item
Symbol
min
typ
max
Unit
Remarks
SupplyCurrent1(AllVDD)
IDD1
-
7.8
9.4
mA Note1,2,3
SupplyCurrent2(AllVDD)
IDD2
15
20
mA Note1,2,4
SupplyCurrent3(AVDDonly)
IDD3
-
-
5
mA Note1,5
Note1: withoutBIASandmodulationcurrent
Note2:I-DAC1=0,I-DAC2=0,Gain=1,PDGAIN=0dB,PDIN=1V
Note3:DATAP=CLKP=“L”,DATAN=CLKN=“H”
Note4:155.52Mbps,PN7
Note5:I-DAC1=I-DAC2=FFh(Fullcode),Gain=1,PDGAIN=0dB,PDIN=1V
2. EEPROM
Item
min
max
Unit
Remarks
Endurance
10000
-
WriteCycle Note1
Dataretention
10
-
Year
JunctionTemperature=85℃
Note1:Thisparameterischaracterizedandisnot100%tested.
ImportantNotice: TheAKMfactory adjusteddataare storedin advanceataddresslocation(Device Address=A6h,
Address = 60h) for the offset of the on-chip temperature sensor. If such excess temperature stress is to be applied to
theAK2573AwhichexceedsaguaranteedEEPROMdataretentionconditions(for10yearsat85C),itisimportantto
readthepre-determinedvalueinadvamceandtore-writethesamedatabackintoEEPROMafteranexposuretothe
excess temperature environment. Even if the exposure time is shorter than the retention time, any accelerated
temperature stress tests (such as baking) are performed, it is recommended to read the pre-set data first and to
re-writeitafterthetest. Accesstoun-usedaddresslocationsisnotfunctionallyguaranteed.
Refertosection-Ⅵ8.3forEEPROMmap.


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