ISSUE 1.5 : December 1998

SYS321000ZK/LK - 012/015/20/25

2

Parameter

Symbol Test Condition

Min Typ

max

Unit

I/P Leakage Current

Address,OE,WE

I

LI

0V < V

-16

-

16

µA

Output Leakage Current

Worst Case

I

LO

CS = V

-16

-

16

µA

Average Supply Current

I

CC1

Min. Cycle, CS = V

-

-

1360

mA

Standby Supply Current

TTL

I

SB1

CS = V

IH

-

-

480

mA

CMOS

I

SB2

CS

--

80

mA

Output Voltage

V

OL

I

-

-

0.4

V

V

OH

I

2.4

-

-

V

Typical values are at V

Voltage on any pin relative to V

SS

V

T

(2)

-0.3

-

7.0

V

Power Dissipation

P

T

-

-

8.0

W

Storage Temperature

T

STG

-55

-

125

Notes : (1)

Stresses above those listed may cause permanent damage to the device. This is a stress rating only

and functional operation of the device at those or any other conditions above those indicated in the

operational sections of this specification is not implied. Exposure to absolute maximum rating

conditions for extended periods may affect device reliability.

(2)

V

DC OPERATING CONDITIONS

Parameter

Symbol

Min

Typ

Max

Unit

Recommended Operating Conditions

Parameter

Symbol

Min

Typ

Max

Unit

Supply Voltage

V

CC

4.5

5.0

5.5

V

Input High Voltage

V

IH

2.2

-

V

V

Input Low Voltage

V

IL

-0.3

-

0.8

V

Operating Temperature

(Commercial)

T

A

0-

70

(Industrial)

T

AI

-40

-

85

Capacitance (V

Note: Capacitance calculated, not measured.

Parameter

Symbol Test Condition

max

Unit

C

IN1

V

64

pF

C

IN2

V

10

pF

I/O Capacitance

C

I/O

V

80

pF

DC Electrical Characteristics (V