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WF5027A2-4 Datasheet(PDF) 11 Page - Nippon Precision Circuits Inc |
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WF5027A2-4 Datasheet(HTML) 11 Page - Nippon Precision Circuits Inc |
11 / 21 page WF5027 series SEIKO NPC CORPORATION —11 For 3rd Overtone Oscillator (5027 ×A to 5027×D) VDD = 1.60 to 3.63V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Parameter Symbol Condition Rating Unit min typ max HIGH-level output voltage VOH Q: Measurement cct 3, IOH = – 8mA, VDD = 2.25 to 3.63V VDD – 0.4 – – V Q: Measurement cct 3, IOH = – 4mA, VDD = 1.60 to 2.25V VDD – 0.4 – – V LOW-level output voltage VOL Q: Measurement cct 3, IOL = 8mA, VDD = 2.25 to 3.63V – – 0.4 V Q: Measurement cct 3, IOL = 4mA, VDD = 1.60 to 2.25V – – 0.4 V HIGH-level input voltage VIH INHN, Measurement cct 4 0.7VDD –– V LOW-level input voltage VIL INHN, Measurement cct 4 – – 0.3VDD V Output leakage current IZ Q: Measurement cct 5, INHN = LOW VOH = VDD – – 10 µA VOL = VSS – 10 – – µA Current consumption*1 *1. The consumption current IDD (CL) with a load capacitance (CL) connected to the Q pin is given by the following equation, where IDD is the no-load con- sumption current and fOUT is the output frequency. IDD (CL) [mA] = IDD [mA] + CL [pF] × VDD [V] × fOUT [MHz] × 10 –3 IDD 5027 ×A, Measurement cct 1, no load, INHN = open, fO = 48MHz VDD = 3.3V – 3.6 5.4 mA VDD = 2.5V – 3.0 4.5 mA VDD = 1.8V – 2.6 3.9 mA 5027 ×B, Measurement cct 1, no load, INHN = open, fO = 54MHz VDD = 3.3V – 3.8 5.7 mA VDD = 2.5V – 3.2 4.8 mA VDD = 1.8V – 2.8 4.2 mA 5027 ×C, Measurement cct 1, no load, INHN = open, fO = 85MHz VDD = 3.3V – 4.8 7.2 mA VDD = 2.5V – 4.0 6.0 mA VDD = 1.8V – 3.4 5.1 mA 5027 ×D, Measurement cct 1, no load, INHN = open, fO = 100MHz VDD = 3.3V – 5.3 8.0 mA VDD = 2.5V – 4.4 6.6 mA VDD = 1.8V – 3.6 5.4 mA Standby current IST Measurement cct 1, INHN = LOW – – 10 µA INHN pull-up resistance RUP1 Measurement cct 6 0.4 1.5 8 M Ω RUP2 30 70 150 k Ω Oscillator feedback resistance Rf 5027 ×A 2.6 3.8 5.0 k Ω 5027 ×B 2.2 3.2 4.2 k Ω 5027 ×C 1.9 2.8 3.7 k Ω 5027 ×D 1.9 2.8 3.7 k Ω Oscillator capacitance CG Design value (a monitor pattern on a wafer is tested), Excluding parasitic capacitance. 5027 ×A 9.6 12 14.4 pF 5027 ×B 6.4 8 9.6 pF 5027 ×C 4.8 6 7.2 pF 5027 ×D 1.6 2 2.4 pF CD Design value (a monitor pattern on a wafer is tested), Excluding parasitic capacitance. 5027 ×A 9.6 12 14.4 pF 5027 ×B 9.6 12 14.4 pF 5027 ×C 6.4 8 9.6 pF 5027 ×D 4.8 6 7.2 pF |
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