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TPCP8002 Datasheet(PDF) 5 Page - Toshiba Semiconductor |
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TPCP8002 Datasheet(HTML) 5 Page - Toshiba Semiconductor |
5 / 7 page TPCP8002 2007-01-16 5 0.1 1 10 100 100 1000 10000 Common source VGS = 0 V f = 1 MHz Ta = 25°C Ciss Coss Crss Ambient temperature Ta (°C) RDS (ON) – Ta Drain −source voltage VDS (V) IDR – VDS Drain −source voltage VDS (V) C – VDS Ambient temperature Ta (°C) Vth – Ta Ambient temperature Ta (°C) PD – Ta Total gate charge Qg (nC) Dynamic input/output characteristics Common source Ta = 25°C Pulse test Common source VDS = −10 V ID = −200 μA Pulse test (1) Device mounted on a glass-epoxy board (a) (Note 2a) (2) Device mounted on a glass-epoxy board (b) (Note 2b) 0 0 20 40 60 4 8 12 16 20 0 2 4 8 10 VDD = 16 V 4 V 8 V VGS Common source ID = 9.1 A Ta = 25°C Single Pulse test VDS 6 0.1 0 10 100 −0.2 −0.4 −0.6 −0.8 −1.2 VGS = −1 V 1 0 5 3 1 −1 0.0 −80 −40 0 40 80 120 160 0.2 0.4 0.8 1.2 0.6 1.0 0.4 0.8 1.6 0 50 100 150 200 1.2 2.0 0 (1) (2) 0 −80 −40 0 40 80 120 160 4 8 12 16 VGS = 4.5 V 2.5 V ID = 2.3,4.5,9.1 A ID = 2.3,4.5,9.1 A 20 Common source Pulse test |
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