CCD area image sensor

S8984, S8985-02

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X-RAY IRRADIATION

MONITORING PHOTODIODE

PD

P1V’

P2V’

TG’

SS

RG’

OG

SG’

P1H’

P2H’

OS

OD

RD

3

Parameter

Symbol

Remark

Min.

Typ.

Max.

Unit

Vertical

100

200

-

Horizontal

-

300

-

Full well capacity

Summing

Fw

-

600

-

ke

-

CCD node sensitivity

Sv

*

5

1.0

1.4

-

µV/e

-

Dark current (MPP mode)

DS

*

6

-

250

2,500

e

Readout noise

Nr

*

7

-

60

-

e

Dynamic range

DR

*

8

-

3,333

-

-

X-ray response non-uniformity

XRNU

*

-

±10

±30

%

White spots

-

-

20

Point

defects *

12

Black spots

-

-

20

Cluster defects

*

13

--

3

Blemish *

11

Column defects

-

*

14

--

1

-

X-ray resolution

∆R

*

9

15

20

-

Lp/mm

Ω.

*6: Dark signal doubles for every 5 to 7 °C.

*7: -40 °C, operating frequency is 1 MHz.

*8: Dynamic range = Full well capacity / Readout noise

*9: X-ray irradiation of 60 kVp, measured at half of the full well capacity.

*10: XRNU (%) = Noise / Signal × 100

Noise: Fixed pattern noise (peak to peak)

In the range that excludes 5 pixels from edges to the center at every position.

*11: Refer to “Characteristics and use of FFT-CCD area image sensor” of technical information.

*12: White spots > 10 times of Max. Dark signal (2500 e

Black spots > 50 % reduction in response relative to adjacent pixels, measured at half of the full well capacity.

*13: continuous 2 to 9 point defects.

*14: continuous > 10 point defects.

s Device structure

KMPDC0220EA

s Pixel format

←

Left

Horizontal Direction

→

Right

Blank

Optical

black

Isolation

Effective

Isolation

Optical

black

Blank

2

2

1

1700

1

0

2

Top

← Vertical direction → Bottom

Isolation

Effective

Isolation

1

1200

1