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TC74LCX00F Datasheet(PDF) 4 Page - Toshiba Semiconductor

Part # TC74LCX00F
Description  Low-Voltage Quad 2-Input NAND Gate with 5-V Tolerant Inputs and Outputs
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Manufacturer  TOSHIBA [Toshiba Semiconductor]
Direct Link  http://www.semicon.toshiba.co.jp/eng
Logo TOSHIBA - Toshiba Semiconductor

TC74LCX00F Datasheet(HTML) 4 Page - Toshiba Semiconductor

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TC74LCX00F/FN/FT/FK
2007-10-19
4
AC Characteristics (Ta = −40 to 85°C)
Characteristics
Symbol
Test Condition
VCC (V)
Min
Max
Unit
2.7
6.0
Propagation delay time
tpLH
tpHL
Figure 1, Figure 2
3.3
± 0.3
1.5
5.2
ns
2.7
Output to output skew
tosLH
tosHL
(Note)
3.3
± 0.3
1.0
ns
Note:
Parameter guaranteed by design.
(tosLH = |tpLHm − tpLHn|, tosHL = |tpHLm − tpHLn|)
Dynamic Switching Characteristics (Ta = 25°C, input: tr = tf = 2.5 ns, CL = 50 pF, RL = 500 Ω)
Characteristics
Symbol
Test Condition
VCC (V)
Typ.
Unit
Quiet output maximum dynamic VOL
VOLP
VIH = 3.3 V, VIL = 0 V
3.3
0.8
V
Quiet output minimum dynamic VOL
|VOLV| VIH = 3.3 V, VIL = 0 V
3.3
0.8
V
Capacitive Characteristics (Ta = 25°C)
Characteristics
Symbol
Test Condition
VCC (V)
Typ.
Unit
Input capacitance
CIN
3.3
7
pF
Output capacitance
COUT
0
8
pF
Power dissipation capacitance
CPD
fIN = 10 MHz
(Note)
3.3
25
pF
Note:
CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating
current consumption without load.
Average operating current can be obtained by the equation:
ICC (opr) = CPD・VCC・fIN + ICC/4 (per gate)


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